Electron Microscopy Group

2023.04.01 Update

Nano structures should be characterized for the developments of advanced materials. Transmission electron microscopy (TEM) is an effective tool for crystal structure analysis and elemental/chemical-bonding analysis with a high spatial and energy resolution. One of our targets is to develop/improve various advanced electron microscopy; scanning transmission electron microscopy (STEM), electron energy-loss spectroscopy (EELS) and energy-dispersive x-ray spectroscopy (EDXS). We also apply the advanced microscopy techniques for various materials, e.g., metals, ceramics, organic materials, semiconductors and nanomaterials collaborating with material scientists of research institutes/companies.

Specialized Research Field

There are a variety of materials characterization techniques based on transmission electron microscopy. Our research expertise is as follows:
  • Development and improvement of high spatial resolution electron microscopy using spherical aberration corrector and monochromator.
  • Nanoscale thermal conduction measurements using micro thermocouples and STEM.
  • Single-molecule direct observation using high-resolution TEM.
  • Development and application of high resolution electron energy-loss spectroscopy using a monochromator.
  • Development of LaB6 nanowire electron source.
  • Development of novel STEM measurement techniques (temperature measurement, high frequency vibration measurement, differential phase contrast).
  • Advanced electron microscopy analyses of battery related materials, thermoelectric materials, organic molecules, polymer-inorganic interfaces, amorphous and nanomaterials.


Group Leader

Koji KIMOTO


Inquiry about this page

Electron Microscopy Group
1-1 Namiki, Tsukuba, Ibaraki 305-0044, JAPAN
E-Mail: KIMOTO.Koji=nims.go.jp(Please change "=" to "@")