Electron Microscopy Group
2023.04.01 Update
Nano structures should be characterized for the developments of advanced materials. Transmission electron microscopy (TEM) is an effective tool for crystal structure analysis and elemental/chemical-bonding analysis with a high spatial and energy resolution. One of our targets is to develop/improve various advanced electron microscopy; scanning transmission electron microscopy (STEM), electron energy-loss spectroscopy (EELS) and energy-dispersive x-ray spectroscopy (EDXS). We also apply the advanced microscopy techniques for various materials, e.g., metals, ceramics, organic materials, semiconductors and nanomaterials collaborating with material scientists of research institutes/companies.
Specialized Research Field
There are a variety of materials characterization techniques based on transmission electron microscopy. Our research expertise is as follows:
- Development and improvement of high spatial resolution electron microscopy using spherical aberration corrector and monochromator.
- Nanoscale thermal conduction measurements using micro thermocouples and STEM.
- Single-molecule direct observation using high-resolution TEM.
- Development and application of high resolution electron energy-loss spectroscopy using a monochromator.
- Development of LaB6 nanowire electron source.
- Development of novel STEM measurement techniques (temperature measurement, high frequency vibration measurement, differential phase contrast).
- Advanced electron microscopy analyses of battery related materials, thermoelectric materials, organic molecules, polymer-inorganic interfaces, amorphous and nanomaterials.