Vol.12 No.03 <April>

What can we Visualize?

2014.06.06 Published


Advanced Materials Characterization Project

Contents

Special Feature

-Advanced Characterization Technologies for Realization of Unknown Properties: Key Technologies that Facilitate Innovation
   Daisuke Fujita (Division Director, Advanced Key Technologies Division, Unit Director, Nano Cahracterization Unit)

- Spin Detection of Monoatomic Surface Layers
    Yasushi Yamauchi (Group Leader, Spin Characterization Group, Nano Characterization Unit)
    Mitsunori Kurahashi (Spin Characterization Group, Nano Characterization Unit)
    Han Zhang (Spin Characterization Group, Nano Characterization Unit)
   
- Observation of Dynamic Behavior of Electrons in a Material -Development of New Technology for Chemical State Analysis-
 
 Hideki Yoshikawa (Group Leader, Chemical Analysis Group, Nano Characterization Unit)
  Sei Fukushima (Surface Chemical Analysis Group, Nano Characterization Unit)
  Shigeo Tanuma (Surface Chemical Analysis Group, Nano Characterization Unit)
  Kunie Ishioka (Surface Characterization Group, Nano Characterization Unit)
  
- Application of Advanced Electron Microscopy for Characterization of Various Materials 
    Koji Kimoto (Electron Microscopy Group, Surface Physics and Structure Unit)

Development of High Field Solid State NMR Technology and Its Application to Material Analysis
    Tadashi Shimizu (Group Leader, High Field NMR Group, Advanced Nano Characterization Center)
    
- Development of High-Pressure Cell to Neutron Scattering Experiments and their Application to Multiferroic Materials
   Hideaki Kitazawa (Unit Director, Quantum Beam Unit)
    Noriki Terada (Neutron Scattering Group, Quantum Beam Unit)

- Characterization of Buried Interfaces Using Synchrotron Radiation Measurement
   Kenji Sakurai (X-Ray Physics Group, Quantum Beam Unit)



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  • Hello from NIMS


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