Vol.11 No.05 <June>

Seeing the nano world.
NIMS Transmission Electron Microscopy Station.

2013.07.22 Published


Contents

Seeing the nano world

NIMS Transmission Electron Microscopy Station

   -Real working environment nanoscale physical characterization TEM
-300 kV field emission-type transmission electron microscope
-200 kV field emission-type transmission electron microscope
-Field emission-type scanning electron microscope
-TEM sample preparation facilities
-Focused ion beam device


NIMS News

  • NIMS and DENKA Establish the "NIMS-DENKA Center of Excellence for Next Generation Materials"
  • Vice Chancellor of UTM visits NIMS.
  • Hello from NIMS


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