Vol.3 No.12 <December>
Special Features: Leading-Edge Electron Microscope Technology Supporting Nanotechnology
Contents
Special Features: Leading-Edge Electron Microscope Technology Supporting Nanotechnology
- The Role of the High Voltage Electron Microscopy Station
- - Electron Microscopy for Nanotechnology and the 21st Century -
- Research Achievements in Nanotechnology Support
- The State of the Art in Advanced Electron Microscopy
- - Aberration-Correction Technology and Internet Microscopy Technology -
- Materials Research using Cryogenic-Temperature Lorentz Electron Microscope
- Precise Analysis of Structural Order and Disorder in Co-Based Layered Cuprates
- Advanced Materials Analysis using TEM-EELS
- Fabrication of Nanostructures Utilizing Substrate Surface Charge Phenomenon and Atomic Level Analysis of the New Nanostructures
- - Development of New Nanostructure using Electron Beam Technique -
- Nanofabrication at the 1 nm Level using Focused Electron Beam
NIMS NEWS
- NIMS Holds Workshop with Polish Institute
- MOU with Germany's University of Hannover
Hello from NIMS
- Igor Solovyev (Russia)
- Yan Ma (China)
