Vol.2 No.10 <August>


2004.08.10 Published



Expansion of Submicron Region Analysis by Electron Micro-Analyzer
Development of High-Accuracy Evaluation Method for Electron Beam Irradiation Damage
Development of He Plasma Ion Source
-High-efficiency ionization technology-
Ultratrace Characterization by High-Selectivity Separation Method


  • MOU with National Nano Device Laboratories in Taiwan
  • NIMS Ecomaterials Center Signs MOU with Switzerland's EMPA
  • NIMS Signs MOUs with Two South African Governmental Research Institutes
  • NIMS Siigns MOU with Nanjing University
  • MOU with University off Connecticutt in the U.S.
  • Appointment of New Vice President

Hello from NIMS

Interdisciplinary Research: Key for Environmental Materials
Nitin K. Labhsetwar (NEERI, India)
Visiting Research Fellow (Jun, 2004-Jul, 2004)
Electroceramics Group, Advanced Materials Laboratory (AML)
Life Enriching Experience
Joka Buha (University of New South Wales, Australia)
Joint International Graduate School Program
(Apr. 2004 - Jul. 2004)
Metallic Nanostructure Group
Materials Engineering Laboratory (MEL)

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