15:30-17:00
Manipulation and Chemical Identification of Individual Atoms by Dynamic Force Microscopy
Prof.Oscar Custance(Division of Electrical, Electronic and Information Engineering Graduate School of Engineering Osaka University)
- Dynamic force microscopy (DFM) is a particularly promising technique in nanoscience. Nowadays, this scanning probe method makes it possible to image metal, semiconductor and insulator surfaces with true atomic resolution [1], to manipulate atoms at surfaces and create sophisticated nanostructures atom-by-atom [2], or to disclose the chemical composition of a surface at atomic scale [3].
In this seminar, we will briefly introduce the technique, and summarize several recent breakthroughs in the field that we have accomplished. In particular, we will present two different approaches to atomic patterning at room temperature using DFM, and discuss the fundamentals behind them, supported by the combination of measurements and first-principles calculations [2, 4]. We will also introduce and demonstrate a method for the chemical identification of individual atoms [3], which is based on the precise quantification of the force associated with the onset of the chemical bonding between the tip-apex outermost atom and the individual surface atoms [3] -a technique known as force spectroscopy [5-7]. Finally, we will briefly discuss the applicability of these new achievements to the study of atomic defects and adsorbates at surfaces of technologically relevant materials like ceria (CeO2), a wide band-gap oxide (6 eV) that holds substantial promise in diverse research areas such as catalysis and solid-fuel cell technology.
References:
[1] F. J. Giessibl, Rev. Mod. Phys. 75, 949 (2003)
[2] Y. Sugimoto, M. Abe, S. Hirayama, N. Oyabu, O.Custance and S. Morita, Nature Materials 4, 156 (2005)
[3] Y. Sugimoto, P. Pou, M. Abe, P. Jelinek, R. Perez, S.Morita, and O. Custance, Nature 446, 64 (2007)
[4] Y. Sugimoto, P. Jelinek, P. Pou, M. Abe, S. Morita, R.Perez and O. Custance, Phys. Rev. Lett. (in press)
[5] M. A. Lantz, et al., Science 291, 2580 (2001)
[6] M. Abe, Y. Sugimoto, O. Custance, and S. Morita, Appl. Phys. Lett. 87, 173503 (2005)
[7] N. Oyabu, P. Pou, Y. Sugimoto, P. Jelinek, M. Abe, S.Morita, R. Perez and O. Custance Phys. Rev. Lett. 96, 106101 (2006)
[8] S. Torbr?gge, M. Reichling, A. Ishiyama, S. Morita and O.Custance (submitted)
