Ｘ線・中性子反射率法についての基礎知識を得るために

1) M.Tolan,“X-ray Scattering from Soft-Matter Thin Films", Springer (1999).
2)V.Holy, U.Pietsch, and T.Baumbach, "High-Resolution X-ray Scattering from Thin Films and Multilayers”, Springer (1999).
3)J.Daillant and A.Gibaud Eds., “X-ray and Neutron Reflectivity: Principles and Applications”, Springer (1999).
4)K.N.Stoev and K.Sakurai, Review on grazing incidence X-ray spectrometry and reflectometry, Spectrochim. Acta B54, 41-82 (1999).
5)KEK Proceedings 2001-25、January 2002 M　“X-ray and Neutron Reflectivity Studies on Thin Films and Multilayers”（平成13年度ＰＦ研究会「Ｘ線・中性子反射率法による薄膜・多層膜の構造解析」）Edited by K.Sakurai and K.Hirano