Publications (downloadable)
2009
145. Spall Fracture of Metallic Aluminum Induced by Penetration of Liquid Gallium-Indium Alloy and Moisture at Room Temperature,
Mari Mizusawa and Kenji Sakurai, Trans MRS Japan, 643-646 (2009).
144. X-ray Reflectivity Evaluation of the Thermal Cycling Effects in Methylcellulose Thin Films,
Vallerie Ann Innis-Samson and Kenji Sakurai, Trans MRS Japan, 639-642 (2009).
143. Inter-correlation of impurity trace elements in bloodstone rock: X-ray fluorescence mapping studies,
Y. Zhang and K. Sakurai, J. Anal. At. Spectrom., 24, 1579-1583 (2009).
142. Stability of thermo-responsive methylcellulose thin film: X-ray reflectivity study,
V. Samson and K. Sakurai, X-Ray Spectrometry, 38, 376-381(2009).
141. Application of X-ray reflectivity technique - Determination of density, thickness and roughness of buried layers and interfaces in multilayered thin films,
K. Sakurai, Oyo-butsuri, 78, 224-230 (2009). (in Japanese) .
140. In-situ observation of melting and freezing process of ice by projection-type X-ray diffraction imaging,
M. Mizusawa and K. Sakurai, Adv. X-Ray Chem Anal. Jpn, 40, 279-290 (2009) (in Japanese).
139. X-ray analysis of Yb ultra thin film: Comparison of gas deposition and ordinary vacuum evaporation
M. Jerab and K. Sakurai, Adv. X-Ray Chem Anal. Jpn, 40, 291-298 (2009) (in English).
138. A simultaneous multiwavelength dispersive X-ray reflectometer for time-resolved reflectometry
T. Matsushita, E. Arakawa, Y. Niwa, Y. Inada, T. Hatano, T. Harada, Y. Higashi, K. Hirano, K. Sakurai, M. Ishii and M. Nomura, The European Physical Journal Special Topics
167, 113-120 (2009).
137. Evaluation of High-Resolution X-ray Absorption and Emission Spectroscopy for the Chemical Speciation of Binary Titanium Compounds
F. Reinhardt, B. Beckhoff, H. Eba, B. Kanngiesser, M. Kolbe, M. Mizusawa, M. Muller, B. Pollakowski, K. Sakurai, and G. Ulm, Anal. Chem., 81, 1770-1776 (2009).
2008
136. Nucleation, Expansion and Compression of Y2O3 Nano-Crystals: Crystallogenesis in Annealing Process of Metalorganic Decomposition Method
Masashi Ishii, Aiko Nakao and Kenji Sakurai, Trans MRS-Japan, 33, 583-586 (2008).
135. Significance of Frequency Analysis in X-ray Reflectivity: Towards analysis which does not depend too much on models
Kenji Sakurai, Mari Mizusawa and Masashi Ishii, Trans MRS-Japan, 33, 523-528 (2008).
134. Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment
P. Colombi, D. K. Agnihotri, V. E. Asadchikov, E. Bontempi, D. K. Bowen, C. H. Chang, L. E. Depero, M. Farnworth, T. Fujimoto, A. Gibaud, M. Jergel, M. Krumrey, T. A. Lafford, A. Lamperti, T. Ma, R. J. Matyi, M. Meduna, S. Milita, K. Sakurai, L. Shabel'nikov, A. Ulyanenkov, A. Van der Lee and C. Wiemer, J. Appl. Cryst. 41, 143-152 (2008).
133. Electronic Tera-Order Stabilization of Photoinduced Metastable Species: Structure of the Photochromic Product of Spiropyran Determined with in situ Single Crystal X-ray Photodiffraction
P. Naumov, P. Yu, and K. Sakurai, J. Phys. Chem. A112, 5810-5814 (2008).
132. X-ray excited 3.2 eV luminescence from amorphous silica: radiative electron relaxation through an unidentified centre and its thermal switching
Masashi Ishii, Tomoko Yoshida and Kenji Sakurai, J. Phys.: Condens. Matter, 20, 255249 (2008).
131. Crystallinity Evaluation of Zinc-Gallate Nanoparticles Using X-Ray Absorption Spectra,
H. Eba and K. Sakurai, Adv. X-Ray Chem Anal. Jpn, 39, 331-340 (2008) (in Japanese).
130. High-speed x-ray reflectometory in multiwavelength-dispersive mode,
T. Matsushita, Y. Niwa, Y. Inada, M. Nomura, M. Ishii, K. Sakurai, E. Arakawa, Appl. Phys. Lett.92, 024103 (2008).
2007
129. XAFS and CEMS study of dilute magneto-optical semiconductor, Fe doped TiO2 films,
K. Nomura, H. Eba, K. Sakurai, A. Rykov, T. Hasegawa, Thin Solid Films 515, 8649-8652 (2007).
128. Curved crystal X-ray optics for a new type of high speed, multiwavelength dispersive X-ray reflectometer,
Tadashi Matsushita, Yasuhiro Inada, Yasuhiro Niwa, Masashi Ishii, Kenji Sakurai and Masaharu Nomura, Journal of Physics: Conference Series 83, 012021 (2007).
127. Application of x-ray reflectivity measurement to monitoring of chemical reactions at 'buried' interface,
Masashi Ishii, Aiko Nakao and Kenji Sakurai, Journal of Physics: Conference Series 83, 012014 (2007).
126. Instrumentation for X-ray reflectivity in micro area: present status and future outlook,
Kenji Sakurai, Mari Mizusawa, Masashi Ishii, Shun-ichi Kobayashi and Yasuhiko Imai, Journal of Physics: Conference Series 83, 012001 (2007).
125. Fixation of Carbon Dioxide and Production of Hydrogen Gas by Iron Powder at Room Temperature,
Hiromi Eba and Kenji Sakurai, Trans MRS-Japan, 32, 725-727 (2007).
124. Direct Observation of Aminyl Radical Intermediate during Single-Crystal to Single-Crystal Photoinduced Orton Rearrangement,
Pance Naumov, Kenji Sakurai, Masahiko Tanaka, and Hideyuki Hara, J. Phys. Chem. B111 (35), 10373 -10378 (2007).
123. Spectrometer for Lanthanides' K X-ray fluorescence,
K. Sakurai, M. Mizusawa, and Y. Terada, Rev. Sci. Instrum 78, 066108 (2007).
122. Structural Study of the Thermally Induced and Photoinduced Phase Transitions of the 1,3,5-Trithia-2,4,6-triazapentalenyl (TTTA) Radical,
Pance Naumov, Jonathan P. Hill, Kenji Sakurai, Masahiko Tanaka, and Katsuhiko Ariga, J. Phys. Chem. A111 (28), 6449 -6455 (2007).
121. Photo Excited Scanning Probe Microscopy for Buried Nano Structure Analyses, 120. Recent Novel X-ray Reflectivity Techniques: Moving Towards Quicker Measurement to Observe Changes at Surface and Buried Interfaces, 119. Observation of transferring elements by quick X-ray fluorescence imaging,
M. Ishii, K. Sakurai, N. R. J. Poolton and B. Hamilton, Trans MRS-Japan, 32, 243-246 (2007).
Kenji Sakurai, Mari Mizusawa and Masashi Ishii, Trans MRS-Japan, 32, 181-186 (2007).
H. Eba and K. Sakurai, Adv. X-Ray Chem Anal. Jpn, 38, 331-340 (2007) (in Japanese).
118. Instrumentation for high-resolution X-ray fluorescence spectroscopy in 35-60 keV region,
K. Sakurai, M. Mizusawa, and Y. Terada, Adv. X-Ray Chem Anal. Jpn, 38, 305-315 (2007) (in Japanese).
117. Efficient Characterization of Combinatorial ZnGa2O4 using Quick X-ray Fluorescence Imaging,
H. Eba and K. Sakurai, Adv. X-Ray Chem Anal. Jpn, 38, 121-130 (2007) (in Japanese).
116. Site Occupancy Determination for Magnetism Evaluation of MnZn-Ferrites using Mn K X-Ray Fluorescence Spectra, 115. Nanometer scale x-ray absorption spectroscopy and chemical states mapping of ultra thin oxides on silicon using electrostatic force microscopy, 114. Increased crystal porosity and enhanced gas adsorption by intracolumnar gliding for broadband gas detection,
H. Eba and K. Sakurai, Adv. X-Ray Chem Anal. Jpn, 38, 109-119 (2007) (in Japanese).
M. Ishii, B. Hamilton, N. R. J. Poolton, N. Rigopoulos, S. De Gendt, K. Sakurai, Appl. Phys. Lett. 90, 063101 (2007)
Pan
e Naumov, Kenji Sakurai, Akihiko Nukui and Masahiko Tanaka, Chem. Commun., 347 (2007).
2006
113. Effects of NaI salt on structures of a spin-cated DMPC liquid film,
N.L.Yamada, N.Torikai, T.Nakai, M.Hshida, K.Sakurai and H.Seto, Physica B, 385-386, 719-721 (2006).
112. A versatile scheme for preparing single-phase yttrium oxysulfate phosphor,
M.Shoji and K.Sakurai, J. Alloys Comp. 426, 244-246 (2006).
111. Photoinduced phase transition of the tetrafluoroborate salt of bis(N,N-diethylethylenediamine)copper(II),
Pance Naumov and Kenji Sakurai, Chemical Physics Letters, 427, 343-345 (2006).
110. X-Ray Reflectivity of Polystyrene-Gadolinium Layered Thin Films,
Carlos Quioshi Hiramatsu, Mari Mizusawa and Kenji Sakurai, KEK Proceedings 2006-3, Bruied Interface Science with X-rays and Neutrons, p.39-41 (2006).
109. Reproducibility and Stability of X-Ray Reflectivity Technique: GaAs/AlAs Multilayer Case,
Mari Mizusawa and Kenji Sakurai, KEK Proceedings 2006-3, Bruied Interface Science with X-rays and Neutrons, p.33-38 (2006).
108. High-Energy White Synchrotron Radiation As a Source for X-Ray Reflectometry: Potential Feasibility,
Kenji Sakurai, Mari Mizusawa and Yasuhiko Imai, KEK Proceedings 2006-3, Bruied Interface Science with X-rays and Neutrons, p.29-32 (2006).
107. Structural basis for the phase switching of bisaminecopper(II) cations at the thermal limits of lattice stability,
Pance Naumov, Kenji Sakurai, Toru Asaka, Alexei A. Belik, Shin-ichi Adachi, Junichi Takahashi and Shin-ya Koshihara, Inorganic Chemistry, 45 (13) 5027-5033 (2006).
106. Measurement of K series of X-ray fluorescence spectra of Ce and Gd by high energy X-ray beam from synchrotron radiation source (in Japanese),
Masaaki Harada, Masahiko Shoji, Hiroshi Kawata and Kenji Sakurai, Bunseki Kagaku, 55(6), 433-439 (2006).
105. Application of in-plane X-ray diffraction technique for residual stress measurement of TiN film/WC-Co alloy (in Japanese),
Shigeki Takago, Haruyuki Yasui, Kaoru Awazu, Toshihiko Sasaki, Yukio Hirose and Kenji Sakurai, Bunseki Kagaku, 55(6), 405-410 (2006).
104. Photoinduced phase transition of coordinationally unsaturated d9 metal centers within the thermal hysteresis of the spin exchange interaction,
Pance Naumov, Kenji Sakurai, Toru Asaka, Alexei A. Belik, Shin-ichi Adachi, Junichi Takahashi and Shin-ya Koshihara, Chem. Communications, (14) 1491-1493 (2006).
103. Thermally induced saccharinate ligand flips close to ambient tempearature,
Pance Naumov, Gligor Jovanovski, and Kenji Sakurai, Crystal Growth & Design, 6, (4) 815-817 (2006).
102. Photoinduced Phase Transition of the Coordinationally Unsaturated d9 Metal Centers of Bis(N,N-diethylethylenediamine)copper(II) Perchlorate within the Thermal Hysteresis of the Spin-Exchange Interaction,
Pance Naumov, Kenji Sakurai, Toru Asaka, Alexei A. Belik, Shin-ichi Adachi, Junichi Takahashi, Shin-ya Koshihara, European Journal of Inorganic Chemistry, 7, 1345-1347 (2006).
101. Rapid combinatorial screening by synchrotron X-ray imaging,
H.Eba and K.Sakurai, Appl. Surf. Sci. 252, 2608-2614 (2006).
100. Annealing effectsin nano-zied gadolinium particles prepared by gas deposition,
Oleksiy Starykov and Kenji Sakurai, VACUUM, 80, 117-121 (2005).
99. Formation of yttrium oxysulfide phosphor at room temperature,
M.Shoji and K.Sakurai, Jpn. J. Appl. Phys.,
98. Bifunctional photochromism based on photoinduced nitro-assisted proton transfer,
Pance Naumov, Kenji Sakurai, Yuji Ohashi, Seik Weng Ng, Chemistry of Materials, 17(22), 5394-5397 (2005).
97. Reversible Thermal Gating of the Photochromic Properties of 3-Methyl-2-(2',4'-dinitrobenzyl)pyridine in a Single Crystal,
Pance Naumov, and Kenji Sakurai, Crystal Growth & Design, 5, (5) 1699-1701 (2005).
96. Intramolecular Nitro-Assisted Proton Transfer in Photoirradiated 2-(2',4'-Dinitrobenzyl)pyridine: Polarized Optical Spectroscopic Study and Electronic Structure Calculations,
Pance Naumov, Kenji Sakurai, Tadahiko Ishikawa, Junichi Takahashi, Shin-ya Koshihara,and Yuji Ohashi, J. Phys. Chem. A109, 7264-7275 (2005).
95. Combinatorial Fluorescence XAFS Imaging of Manganese Complex Oxides,
H.Eba and K.Sakurai, Chemistry Letters 34, 872-873 (2005).
94. Determination of interface roughness of Gd films deposited on Si surface using improved wavelet transform of X-ray reflectivity data,
O.Starykov and K.Sakurai, Appl. Surf. Sci. 244, 235-239 (2005)
93. Enhancement of CO2 Absorbance for Lithium Ferrite - Combinatorial Application of X-Ray Absorption Fine Structure Imaging,
H.Eba and K.Sakurai, Materials Trans. 46, 665-668 (2005).
92. Site Occupancy Determination for Manganese in Some Spinel-Type Oxides by K<beta> X-Ray Fluorescence Spectra,
H.Eba and K.Sakurai, J. Solid State Chem. 178, 370-375 (2005).
91. Specimen Preparation from Natural Water for TXRF analysis using Johansson Wavelength-Dispersive Spectrometer,
S.Kurunczi and K.Sakurai, X-Ray Spectrometry, 34, 56-58 (2005).
90. Pattern transition in Cu-Zn binary electrochemical deposition,
H.Eba and K.Sakurai, J. Electroanalytical Chem., 571, 149-158 (2004).
89. Quick Element Mapping by Projection-Type X-Ray Fluorescence Imaging,
K.Sakurai, Oyo-butsuri, 73, 754-758 (2004). (in Japanese)
88. Fast x-ray fluorescence camera combined with wide band pass monochromatic synchrotron beam,
K.Sakurai and M.Mizusawa, AIP Conference Proceedings 705 (Synchrotron Radiation Instrumentation 2003, San Francisco, USA) 889-892 (2004).
87. Quick atomic-scale structure imaging by synchrotron X-rays: A new tool for probing realistic inhomogeneous systems,
K.Sakurai and M.Mizusawa, Nanotechnology, 15, S428 - S431 (2004).
86. A compact Johansson spectrometer (R=100mm) for X-ray fluorescence,
K.Sakurai, Adv. X-Ray Chem Anal. Jpn, 35, 201-208 (2004) (in Japanese) .
85. Sample Preparation for Wavelength-Dispersive Total-Reflection X-Ray Fluorescence Analysis of Trace Elements in Natural Water,
S.Kurunczi, M.Shoji and K.Sakurai, Adv. X-Ray Chem Anal. Jpn, 35, 181-192 (2004) (in Japanese)
84. X-Ray Reflectometry,
K.Sakurai, Kinzoku, 74, No.3, 305-313 (2004). (in Japanese)
83. XAFS Imaging of Tsukuba Gabbroic Rocks: Area Analysis of Chemical Composition and Local Structure,
M.Mizusawa and K.Sakurai, J. Synchrotron Rad. 11, 209-213 (2004).
82. X-Ray Absorption Fine Structure (XAFS) ,
K.Sakurai,Kinzoku, 74, No.2, 185-192 (2004). (in Japanese)
81. X-Ray Reflectivity Studies on Buried GaAs Quantum Dots: Non-Destructive Determination of Depth and Density,
M.Mizusawa and K.Sakurai, Trans. Mater. Res. Soc. Jpn. 28, Special Issue (Nov. 2003), 51-54 (2003).
80. X-Ray Fluorescence Microscope - Recent Trends of New Element Mapping Technique Without Scans,
K.Sakurai, H.Eba and M.Mizusawa, Bunseki, (11) 644-651 (2003). (in Japanese)
79. "Doughnut-shaped" Coloration of V2O5 upon Laser Irradiation: Another Evidence of Visible Light Photochromism of V2O5,
S.Nishio, M.Kakihana, H.Eba and K.Sakurai, Jpn. J. Appl. Phys., 42, 5670-5671 (2003).
78. Density Gradient of a Mirror-Polished Rutile (110) Surface : X-Ray Reflectivity Evaluation,
M.Mizusawa, K.Stoev and K.Sakurai, Jpn. J. Appl. Phys., 42, 3709-3710 (2003).
77. Factors Causing Intensity Changes in K Emission Spectra of Lanthanide Compounds -Feasibility for Chemical Speciation,
M.Harada and K.Sakurai, Adv. X-Ray Chem Anal. Jpn,34, 195-206 (2003) (in Japanese)
76. Mechanochemical Formation of Novel Catalyst for Preparing Carbon Nanotubes: Nanocrystalline Yttrium Aluminum Iron Perovskite,
X. Guo, J. Qi and K. Sakurai, Scripta Mater. 48, 1185-1188 (2003).
75. Specular and non-specular X-ray reflection from a single-crystal molybdenum mirror surface,
M.Mizusawa and K.Sakurai, Nucl. Instrum, & Methods B199, 139-142 (2003).
74. Chemical characterization using relative intensity of manganese Kb ' and Kb5 X-ray fluorescence,
K.Sakurai and H.Eba, Nucl. Instrum, & Methods B199, 391-395 (2003).
73. Micro X-ray fluorescence imaging without scans: Towards an element-selective movie,
K.Sakurai and H.Eba, Anal. Chem. 75, 355-359 (2003).
72. Quick X-Ray Fluorescence Imaging Without Scans,
K.Sakurai, H.Eba and M.Mizusawa, Materia Japan, 41, 616-622 (2002). (in Japanese)
71. Wavelength-dispersive total-reflection X-ray fluorescence with an efficient Johansson spectrometer and an undulator X-ray source: Detection of 10-16 g-level trace metals,
Kenji Sakurai, Hiromi Eba, Katsuaki Inoue, and Naoto Yagi, Anal. Chem. 74, 4532-4535 (2002).
70. X-Ray Reflectivity Analysis of Periodic Silver Nanoparticles Multilayer,
S.Kuwajima, Y.Yoshida, K.Abe, N.Tanigaki, K.Yase, H.Nagasawa and K.Sakurai, Adv. X-Ray Chem Anal. Jpn, 33,135-143 (2002). (in Japanese)
69. X-Ray Reflectivity for Graded Surfaces: Calculations,
M.Mizusawa and K.Sakurai, Adv. X-Ray Chem Anal. Jpn, 33, 175-184 (2002). (in Japanese)
68. X-Ray Fluorescence Microscope for Movie Application,
K.Sakurai, Adv. X-Ray Chem Anal. Jpn, 33, 245-251 (2002). (in Japanese)
67. Intensity Ratio of Mn(II) Kb' and Kb5 X-ray fluorescence: Feasibility for trace chemical speciation with undulator X-ray source,
H.Eba and K.Sakurai, Adv. X-Ray Chem Anal. Jpn, 33, 253-260 (2002). (in Japanese)
66. Fast signal processing of YAP:Ce detector for synchrotron X-ray experiments,
M.Harada, K.Sakurai, K.Saito and S.Kishimoto, Rev. Sci. Instrum.72, 4308-4311 (2001)
65. Downsizing of Johansson spectrometer for x-ray fluorescence trace analysis with brilliant undulator source,
K.Sakurai, H.Eba, K.Inoue and N.Yagi, Nucl. Instrum, & Methods A467-468, 1549-1552 (2001).
64. Formation yttrium aluminium preovskite fine powders by a polymerized complex reaction,
M.Harada, A.Ue, M.Inoue, X.Guo, and K.Sakurai, J. Mater. Sci. Lett. 20, 741-742 (2001).
63. Structural Characterization of the Monolayer and Regularly-Stacked Multi-Layers of Silver Nanoparticles by Using X-ray Reflectivity,
S. Kuwajima, Y. Okada, Y. Yoshida, K. Abe, N. Tanigaki, K. Yase, T. Yamaguchi, H. Nagasawa, and K. Sakurai, Colloids and Surfaces A197, 1-5 (2001).
62. Effect of 3-dimensional stacking for silver nanoparticle multilayers,
S. Kuwajima, Y. Okada, Y. Yoshida, K. Abe, T. Yamaguchi, H. Nagasawa, N. Tanigaki, K. Sakurai and K. Yase, Molecular Crystals and Liquid Crystals 370, 223-226 (2001).
61. Atomic structure around Mn Ions in Zn1-xMnxS(x=0.01-0.02) nanocrystals prepared by colloidal chemistry procedure,
J. Qi, X. Guo, K. Sakurai and Y. Masumoto, Scripta Mater. 44, 2315-2319 (2001).
60. Synthesis of YAP:Ce phosphor through a complex polymerizing reaction,
M.Harada, A.Ue, M.Inoue, X.Guo, and K.Sakurai, Scripta Mater. 44, 2243-2246 (2001).
59. Mechanical solid-state formation of Y1-xCexAlO3 and its application as an X-ray scintillator,
K.Sakurai and X.Guo, Materials Science and Engineering A304-306, 403-407 (2001)
58. Local Atomic Image of 0.02% Zn in GaAs Wafers Using X-ray Holography,
K.Hayashi, T.Yamamoto, J.Kawai, M.Suzuki, S.Goto, S.Hayakawa, K.Sakurai and Y.Gohshi, Adv. in X-ray Anal., 42, 181-190 (2000)
57. Trace Chemical Characterization Using Monochromatic X-ray Undulator Radiation,
H. Eba, C. Numako, J. Iihara, and K. Sakurai, Anal. Chem.,72, 2613-2617 (2000)
56. Formation of Yttrium Aluminum Perovskite and Yttrium Aluminum Garnet by Mechanical Solid-State Reaction,
X.Guo and K.Sakurai, Jpn. J. Appl. Phys. 39. 1230-1234 (2000)
55. Crystallization of yttrium aluminum perovskite at around room temperature,
X.Guo and K.Sakurai, J. Mater. Sci. Lett., 19, 451-452 (2000)
54. Total-reflection X-ray Fluorescence Imaging,
K.Sakurai, Spectrochim. Acta B54 1497-1503 (1999).
53. Grazing Incidence X-ray Fluorescence and Scattering Experiments at BL-39XU, SPring-8,
K.Sakurai, H.Eba, and S.Goto, Jpn. J. Appl. Phys. Suppl.38-1, 332-335 (1999).
52. X-Ray Fluorescence Analysis with a Johansson-type Spectrometer,
K.Sakurai and H.Eba, Jpn. J. Appl. Phys. Suppl. 38-1, 650-653 (1999).
51. Extended X-ray Absorption Fine Structure(EXAFS) Technique, K.Sakurai, Ferum Vol.4, No.5 32-38 (1999). (in Japanese)
50. Review on grazing incidence X-ray spectrometry and reflectometry,
K.N.Stoev and K.Sakurai, Spectrochim. Acta B54, 41-82 (1999).
49. K-line x-ray fluorescence analysis of high-Z elements,
M.Harada and K.Sakurai, Spectrochim. Acta B54, 29-39 (1999).
48. Recent performance of laboratory-scale x-ray absorption fine structure instruments,
K.Sakurai and X.Guo, Spectrochim. Acta B54, 99-107 (1999).
47. Atomic-Resolution X-Ray Fluorescence Holography of Zn (0.02wt%) in a GaAs Wafer, K.Hayashi, T.Yamamoto, J.Kawai, M.Suzuki, S, Goto, S.Hayakawa, K.Sakurai and Y.Gohshi, Anal. Sci.14, 987-990 (1998).
46. Trace heavy element analysis using X-ray fluorescence with quasi-monochromatic high-energy photons : Iodine in an environmental sample,
M.Harada and K.Sakurai, Jpn. J. Appl. Phys., 37, 2740-2741 (1998).
45. Grazing incidence reflectometer for BL-39XU at SPring-8,
K.Sakurai, S.Uehara and S.Goto, J. Synchrotron Rad. 5, 554-556 (1998).
44. X-ray Diffraction/ Scattering Techniques Using Total-Reflection and/or Grazing Incidence Geometry,
K.Sakurai and Luc Ortega, Bunseki. No.3 164-174 (1998). (in Japanese)
43. Recent theoretical models in grazing incidence X-ray reflectometry,
K.Stoev and K.Sakurai, Rigaku Journal 14, 22-37 (1997).
42. Study on diluted magnetic semiconductors Zn1-xMnxB (B=S,Se) synthesis and structural characterization: ,
S.D.Deshpande and K.Sakurai, J. Surf. Anal.3, 494-497 (1997).
41. Trace chemical characterization of liquid drop by fluorescence detection of absorption edge shifts using total reflection support,
K.Sakurai, A.Iida and H.Shintani, J. Phys. IV (France) 7, C2-713 (1997).
40. Development of high power X-ray generator with LaB6 cathode and its application to fluorescence XAFS measuremen,
K.Sakurai and N.Osaka, J. Phys. IV (France) 7, C2-327 (1997).
39. Analysis of specific interface of thin films by X-ray fluorescence using interference effect in total reflection,
K.Sakurai and A.Iida, Adv. in X-Ray Anal. 39, 695-700 (1997).
38. New rotating anode X-ray generator for XAFS experiments,
K.Sakurai, N.Osaka, H.Sakurai and H.Izawa, Adv. in X-Ray Anal. 39, 149-153 (1997).
37. Fast Main Amplifiers Modified for High-Counting-Rate X-Ray Measurements,
M.Harada and K.Sakurai, Adv. in X-Ray Chem. Anal. Japan 28. 277-288 (1997). (in Japanese)
36. Progress in Total Reflection X-Ray Fluorescence,
K.Sakurai, Krassimir Stoev, Bunseki, No.7, 575-582 (1997). (in Japanese)
35. Narrow pulse shaping for high-counting-rate X-ray measurements,
M.Harada and K.Sakurai, Rev. Sci. Instrum. 67, 615-616 (1996).
34. Enhanced X-ray fluorescence detection of interfaces in thin films using interference effect in X-ray total reflection,
K.Sakurai, SR Science and Technology Information, 6, No.2, 2-7 (1996). (in Japanese)
33. High power X-ray generator for XAFS experiments,
K.Sakurai and H.Sakurai, The Rigaku Journal 12, 41 (1995).
32. High-intensity low tube-voltage X-ray source for laboratory extended x-ray absorption fine-structure measurements,
K.Sakurai and H.Sakurai, Rev. Sci. Instrum. 64, 2702-2703 (1994); 65, 2417-2418 (1995).
31. Nitrogen effect in mechanical alloying of immiscible Cu-V: Extended x-ray absorption fine structure study,
K.Sakurai, C.H.Lee, N.Kuroda, T.Fukunaga and U.Mizutani, J. Appl. Phys. 75, 7752-7755 (1994).
30. Grazing incidence X-ray reflectance measurement of surface and interface roughness on the sub-nanometer scale,
M.Wormington, K.Sakurai, D.K.Bowen and B.K.Tanner, Mat. Res. Soc. Symp. Proc. 332, 525-530 (1994).
29. Development of High-Power X-ray Generator for EXAFS Experiments,
H.Sakurai, H.Izawa, A.Morita and K.Sakurai, Materia (Bull. Jpn. Inst. Metals). 33, 817-819 (1994). (in Japanese)
28. Fluorescent X-ray interference effect in layered materials,
T.Noma, A.Iida and K.Sakurai, Phys. Rev. B48, 17524-17526 (1993).
27. EXAFS experiments with high-power rotating anode x-rays,
K.Sakurai, Jpn. J. Appl. Phys. Suppl.32-2, 261-263 (1993).
26. High-intensity x-ray line focal spot for laboratory extended x-ray absorption fine-structure experiments,
K.Sakurai, Rev. Sci. Instrum. 64, 267-268 (1993).
25. A Super High-power Rotating Anode X-Ray Source for EXAFS Measurements,
K.Sakurai, Adv. in X-Ray Chem. Anal. Japan. 24, 187-198 (1993). (in Japanese)
24. Grazing Incidence X-ray Fluorescence Spectrometry and Reflectrometry with Synchrotron Radiation -A New Tool for Characterization of Thin Films-,
K.Sakurai, Bull. Jpn. Inst. Metals 32, 323-330 (1993). (in Japanese)
23. Laboratory EXAFS - Introduction for Optical Scientists and Engineers,
K.Sakurai, O plus E 162, 109-113 (1993). (in Japanese)
22. Structural evidence for the amorphization of mechanically alloyed Cu-Ta powders studied by neutron diffraction and EXAFS,
C.H.Lee, M.Mori, T.Fukunaga, K.Sakurai and U.Mizutani, Mater. Sci. Forum 88-90, 399-406 (1992).
21. Extended x-ray-absorption fine-structure studies on ball-milled powders of the immiscible system Cu-V,
K.Sakurai, M.Mori and U.Mizutani, Phys. Rev. B46, 5711-5714 (1992).
20. Layer thickness determination of thin films by grazing incidence X-ray experiments using interference effect,
K.Sakurai and A.Iida, Adv. in X-ray Anal. 35, 813-818 (1992).
19. Fourier analysis of interference structure in X-ray specular reflection from thin films,
K.Sakurai and A.Iida, Jpn. J. Appl. Phys. 31, L113-L115 (1992).
18. Solid state amorphization in Cu-Ta alloy system,
K.Sakurai, Y.Yamada, C.H.Lee, T.Fukunaga and U.Mizutani, Mater. Sci. & Eng. A134, 1414-1417 (1991).
17. Amorphization of 1mmiscible Cu-Ta Powders Subjected to Mechanical Alloying,
C.H.Lee, K.Sakurai, T.Fukunaga, U.Mizutani, Jpn. Soc. Powder & Powder Metall 38, 83-86 (1991). (in Japanese)
16. Observation of solid-state amorphization in the immiscible system Cu-Ta,
K.Sakurai, Y.Yamada, M.Ito, C.H.Lee, T.Fukunaga and U.Mizutani, Appl. Phys. Lett. 57, 2660-2662 (1990).
15. Near-surface chemical characterization using grazing incidence X-ray fluorescence,
K.Sakurai and A.Iida, Adv. in X-ray Anal. 33, 205-211 (1990).
14. Chemical state analysis by X-ray fluorescence using absorption edge shifts,
K.Sakurai, A.Iida and Y.Gohshi, Adv. in X-ray Anal. 32, 167 -176 (1989).
13. SR X-ray fluorescence imaging by image reconstruction technique,
A.Iida, M.Takahashi, K.Sakurai and Y.Gohshi, Rev. Sci. Instrum. 60, 2458-2461 (1989).
12. Analysis of contamination layer of InP during LPE process by synchrotron radiation-excited X-ray fluorescence,
A.Iida, K.Sakurai, Y.Gohshi and S.Komiya, Jpn. J. Appl. Phys. 27, L1825-L1828 (1988).
11. Chemical state mapping by X-ray fluorescence using absorption edge shifts,
K.Sakurai, A.Iida, M.Takahashi and Y.Gohshi, Jpn. J. Appl. Phys. 27, L1768-L1771 (1988).
10. A scanning X-ray fluorescence microprobe with synchrotron radiation,
Y.Gohshi, S.Aoki, A.Iida, S.Hayakawa, H.Yamaji and K.Sakurai, Adv. in X-ray Anal. 31, 495-502 (1988).
9. Near surface analysis of semiconductor using grazing incidence X-ray fluorescence,
A. Iida, K.Sakurai and Y.Gohshi, Adv. in X-ray Anal. 31, 487-494 (1988).
8. Chemical state analysis by X-ray fluorescence using shifts of iron K absorption edge,
K.Sakurai, A.Iida and Y.Gohshi, Anal. Sci. 4, 37-42 (1988).
7. Analysis of signal to background ratio in synchrotron radiation X-ray fluorescence,
K.Sakurai, A.Iida and Y.Gohshi, Anal. Sci. 4, 3-7 (1988).
6. Chemial State Analysis of Trace Elements by X-Ray Fluorescence Using Absorption Edge Shifts,
K.Sakurai, A.Iida, Y.Gohshi, Adv. in X-Ray Chem. Anal. Japan 19, 57-70 (1988). (in Japanese)
5. Characterization of Co-O thin films by X-ray fluorescence using chemical shifts of absorption edges,
K.Sakurai, A.Iida and Y.Gohshi, Jpn. J. Appl. Phys. 26, 1937-1938 (1987).
4. A scanning X-ray fluorescence microprobe with synchrotron radiation,
Y.Gohshi, S.Aoki, A.Iida, S.Hayakawa, H.Yamaji and K.Sakurai, Jpn. J. Appl. Phys. 26, L1260-L1262 (1987).
3. Synchrotron radiation excited X-ray fluorescence analysis using total reflection of X-rays,
A. Iida, A.Yoshinaga, K.Sakurai and Y.Gohshi, Anal. Chem. 58, 394-397 (1986).
2. Grazing incidence X-ray fluorescence analysis,
A. Iida, K.Sakurai and Y.Gohshi, Nucl. Instrum. & Methods A246, 736-738 (1986).
1. Energy dispersive X-ray fluorescence analysis with synchrotron radiation,
A. Iida, K.Sakurai, T.Matsushita and Y.Gohshi, Nucl. Instrum. & Methods 228, 556 -563(1985).
JAPANESE
