Education

Ph.D. in Science (Physics), Universidad Autonoma de Madrid, Spain, 2002

Graduate in Science (Condensed Matter Physics), Universidad Autonoma de Madrid, Spain, 1996

Professional Experience

Februay 2008– to present: Senior Research (Group Leader)

Nanomechanics Group, Advanced Nano Characterization Center, National Institute for Materials Science (NIMS), Japan

April 2006–January 2008: Visiting Associate Professor

Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, Japan

April 2005–March 2006: Specially Appointed Associate Professor

Handai Frontier Research Center, Graduate School of Engineering, Osaka University, Japan

February 2002–March 2005: Research Associate

Handai Frontier Research Center, Graduate School of Engineering. Osaka University, Japan

October 1998–January 2002: Assistant Professor

Condensed Matter Physics Department, Universidad Autonoma de Madrid, Spain

Oscar Custance is a scientist specialized in atomic resolution dynamic force microscopy (DFM) operated using the frequency modulation detection method –a technique also known as non-contact atomic force microscopy (NC-AFM). He also has a strong background on atomic resolution scanning tunneling microscopy (STM) and spectroscopy (STS) in ultra high vacuum environment.

Motivated by the potential of atomic resolution DFM, as well as by a marked interest in the Japanese culture, he joined Prof. Seizo Morita's Laboratory (Osaka University, Japan) as a postdoctoral fellow in February of 2002. Due to his remarkable research results, published in high visibility journals, and the impact of his skills for the direction and coordination of both research lines and researchers in the work of the group, he was promoted to Visiting Associate Professor in 2005.

Since February 2008, he is a permanent researcher at the National Institute for Materials Sciences (NIMS), and leader of the Nanomechanics Group of the Advanced Nano Characterization Center. His current research activities focus on applying dynamic force microscopy and the atomic manipulation, force spectroscopy and chemical identification tools he has contributed to develop to clarify problem in material science at atomic and molecular scale. He also has a strong commitment to further develop the DFM detection technique towards the achievement of highest sensitivity, and explore other instruments and techniques with relevance in nanomechanics studies and nanoscience in general.

Languages

Spanish, English, Japanese

Last update: January 2010