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    The NIMS’s Atomic Force Probe Group focuses its research activities on studying technologically relevant materials from an atomistic perspective using scanning probe microscopy (SPM).

    To this end, we apply advanced SPM techniques based on simultaneous scanning tunneling microscopy (STM) and atomic force microscopy (AFM) detection with atomic resolution. Some of these tools include atom and molecular manipulation, three-dimensional force spectroscopy / scanning tunneling spectroscopy, and Kelvin Probe Force Microscopy, among others.

For the simultaneous detection of tunneling currents and inter-atomic forces, we use both conductive cantilevers as well as novel AFM sensors based on piezo electric detection.

Tomoko got a PRESTO grant! Congratulations!

New paper published by Tomoko.

We are organizing the NC-AFM 2014 conference.

Check out this video of kids manipulating 
       atoms using AFM in our lab.

Oleksandr Stetsovych has managed to extend his research stay with us until the end of December 2013.

Fabian Menges, from IBM Zurich, will visit us for two months as NIMS Internship Student under the Join Study Agreement with IBM for the development of a high resolution Scanning Thermal Microscope.

On August, Oscar will be at the NC-AFM 2013 conference and give an invited talk at the Symposium “Atomic Force Microscopy for Energy Applications”.

On June, Cesar will be at the “International Symposium on Green Manufacturing and Applications” (ISGMA 2013) in Hawaii (US).

On the 1st of April 2013, Dr. Tomoko Shimizu joined the group as a NIMS senior scientist. (permanent position).

Copyright © Oscar Custance. All rights reserved.

Last update: October 2013

Atomic Force Probe Group / Nano Characterization Unit / Advanced Key Technologies Division

National Institute for Materials Science

Sengen Site / Interface Materials Building

Sengen 1-2-1, Tsukuba, Ibaraki, Japan

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