The NIMS’s Atomic Force Probe Group focuses its research activities on studying technologically relevant materials from an atomistic perspective using scanning probe microscopy (SPM).

    To this end, we apply advanced SPM techniques based on simultaneous scanning tunneling microscopy (STM) and atomic force microscopy (AFM) detection with atomic resolution. Some of these tools include atom and molecular manipulation, three-dimensional force spectroscopy / scanning tunneling spectroscopy, and Kelvin Probe Force Microscopy, among others.

For the simultaneous detection of tunneling currents and inter-atomic forces, we use both conductive cantilevers as well as novel AFM sensors based on piezo electric detection.