Gallery and Media

People

Instrumentation

Research

Publications


    The NIMS’s Atomic Force Probe Group focuses its research activities on studying technologically relevant materials from an atomistic perspective using scanning probe microscopy (SPM).


    To this end, we apply advanced SPM techniques based on simultaneous scanning tunneling microscopy (STM) and atomic force microscopy (AFM) detection with atomic resolution. Some of these tools include atom and molecular manipulation, three-dimensional force spectroscopy / scanning tunneling spectroscopy, and Kelvin Probe Force Microscopy, among others.


For the simultaneous detection of tunneling currents and inter-atomic forces, we use both conductive cantilevers as well as novel AFM sensors based on piezo electric detection.


Mr. Fabian Menges, from IBM Zurich, will visit us for two months as NIMS Internship Student under the Join Study Agreement with IBM for the development of a high resolution Scanning Thermal Microscope.

On August, Oscar will be at the NC-AFM 2013 conference and give an invited talk at the Symposium “Atomic Force Microscopy for Energy Applications”.

On June, Cesar will be at the “International Symposium on Green Manufacturing and Applications” (ISGMA 2013) in Hawaii (US).

On the 1st of April 2013, Dr. Tomoko Shimizu joined the group as a NIMS senior scientist. (permanent position).

On mid-April, Cesar will attend the IMAGENANO 2013 conference in Bilbao (Spain) and give an invited talk at the “Scanning Probe Microscopy international conference 2013”.

At the beginning of April, Oscar will be at the MRS 2013 Meeting in San Francisco (US) and give an invited talk at the Symposium “Advances in Scanning Probe Microscopy for Imaging Functionality on the Nanoscale”.

Last October, Oleksandr Stetsovych returned to our group for a one-year research stay under the NIMS Graduate Program with the Charles University (Prague, Czech Republic). He will be at NIMS until the end of September 2013, and this will be his second year working with us.
 
People.html
Instrumentation.html
Publications.html
Gallery_and_Media.html

Copyright © Oscar Custance. All rights reserved.

Last update: June 2013

Atomic Force Probe Group / Nano Characterization Unit / Advanced Key Technologies Division

National Institute for Materials Science

Sengen Site / Interface Materials Building

Sengen 1-2-1, Tsukuba, Ibaraki, Japan

What’s new!

About us

Research.html
Back to main