Dynamic Force Microscopy

Atomic level studies on semiconductor (Si, Ge) and insulator (CeO₂, MgO, KBr, KCl, NaCl) surfaces

Dynamic Force Spectroscopy

Vertical and lateral manipulation of single atoms and molecules at semiconductor and insulator surfaces

Dynamic Force Spectroscopy based chemical identification of individual atoms in multi-element systems

Scanning Tunneling Microscopy

Diffusion of single atoms at semiconductor surfaces

Dynamic processes on surfaces at atomic level

Atomic level characterization of temperature-mediated phase transitions

Scanning Tunneling Spectroscopy

Design and assembly of several scanning tunneling microscopes and ultrahigh vacuum components

Design and assembly of several scanning probe microscopes and ultrahigh vacuum components