Electro-nanocharacterization group is exploring electrical characterization of individual nanostructures which is a key to future nano-technology and electronics. For measuring electrical properties of individual nanostructures, we have developed multiple-probe scanning tunneling microscopes (MP-STM) which have independently-driven two, three, and four STM tips. Our MP-STM's have been successfully applied to reveal electrical resistivities of ErSi2 nanowires and fullerene nanofilms. We are also developing new MP-scanning probe microscopes for investigating functionality of nanostructures. In addition to the development of novel techniques, study on the creation of various nanostructures such as nanofilms and nanowires is an important part of our research in order to confirm versatility of our novel techniques and nanostructures themselves.
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