Masanori Mitome
- Affiliation:
- Nanotubes Unit, Nanotubes Group
- Specialty:
- Crystal Structure Analysis, Electron Microscopy
- Academic degree:
- Ph.D. in Science, Tokyo Institute of Technology (1997)
- Recent publications
- See NIMS Researchers DB
Educational and Working History
| 2001 | - | Present | Senior Researcher, National Institute for Materials Science |
| 1997 | Researcher, National Institute for Research in Inorganic Materials | ||
| 1997 | Ph.D. in Science, Tokyo Institute of Technology | ||
| 1990 | Researcher, Canon Inc. |
Research Interests
He has proposed a new observation technique of electron microscopy that is named Convergent Beam Illumination (CBI) method. Electron beam with a convergent angle of a few mrad is used in the method and coherency of the electron beam is tuned as obtaining a good resolution. The technique suppresses pseudo images caused from interference fringes and the images taken with the method can be interpreted intuitively.
He analyzed many structures of nanoscale materials such as nanotubes, nanorods, nano particles by electron microscopy. Furthermore he made an effort for 'in-situ' observation of various properties of the nanoscale materials in an electron microscope, ex. melting point, phase transition, I-V measurement, and mechanical properties.
Selected Papers
- S. Kuroda, N. Nishizawa, K. Takita, M. Mitome, Y. Bando, K. Osuch, and T. Dietl, 'Origin and control of high-temperature ferromagnetism in semiconductors.' Nature Mater., 6, (2007), 440-446.
- D. Golberg, P. M. F. J. Costa, O. Lourie, M. Mitome, X. D. Bai, K. Kurashima, C. Y. Zhi, C. C. Tang, and Y. Bando, 'Direct force measurements and kinking under elastic deformation of individual multiwalled boron nitride nanotubes.' Nano Lett., 7, (2007), 2146-2151.
- M. Mitome, S. Kohiki, K. Hori, M. Fukuta, and Y. Bando, 'Epitaxial growth of β-Ga2O3 nanocolumns on MgO substrate.' J. Cryst. Growth, 286, (2006), 240-246.
- M. Mitome, 'Visibility of Si nanoparticles embedded in an amorphous SiO2 matrix.' J. Electron Microsc., 55, (2006), 201-207.
- M. Mitome, Y. Bando, D. Golberg, K. Kurashima, Y. Okura, T. Kaneyama, M. Naruse, and Y. Honda, 'Nanoanalysis by a high-resolution energy filtering transmission electron microscope.' Microsc. Res. Techniq., 63, (2004), 140-148.