Invited talks

Partial List (International conferences)

145.
Reversible control of local chemical reactions at the molecular scale for low-dimensional electronic devices,
M. Aono, T. Nakayama, M. Nakaya, T. Hasegawa, K. Terabe, T. Sakamoto, Y. Kuwahara, M. Akai,
214th ECS Meeting, PRiME 2008 (Honolulu, Hawaii, U. S. A.)
144.
Electrical conductivity of organic and inorganic nanowires,
M. Aono, T. Nakayama, T. Hasegawa, and Y. Kuwahara,
International Workshop “Quantum transport in nanostructures” (Hamburg, Spain, Oct., 2008).
143.
Dynamic control of electrical conductivity of single polymer chains for molecular nanowiring,
M. Aono,　M. Akai, Y. Kuwahara, Y. Okawa,
TNT2008 (Ovideo, Spain, Sept., 2008)
142.
Control of Nanochemical Reactions,
M. Aono,
International 21st Century COE Symposium on Atomistic Fabrication Technology 2007 (Osaka, Japan, 2007).
141.
Electrical conductivity of low-dimensional nanostructures,
M. Aono, T. Nakayama, Y. Shingaya, O. Kubo and M. Nakaya,
212 ECS Meeting (Washington, DC, U. S. A., Oct., 2007).
140.
Nanoscale Ionic and Molecular Dynamics – New Horizons of Nanotechnology,
M. Aono,
The 17th Iketani Conference; Doyama Symposium (Tokyo, Sept., 2007).
139.
Scanning Tunneling Microscopy and Photons,
M. Aono,
International Conference on Materials for Advanced Technologies 2007 (Singapore, July, 2007).
138.
Reversibly controlling nanoscale chemical and physical processes by applied voltage,
M. Aono,
Swiss Nanoconvension 2007 (Berne, Swiss, June, 2007).
137.
Controlling Chemical and Physical Changes Reversibly at the Nanoscale,
M. Aono,
International Nanoscience Symposium (Hamburg, Germany, May-June, 2007).
136.
Multiprobe Scanning Tunneling Microscopy of the Electrical Conductivity of Low-dimensional Nanostructures,
M. Aono,
PCSI-34 (Salt Lake City, U. S. A., Jan., 2007).
135.
Nanoscale Electrical Conduction,
M. Aono,
ICSPM14 (Atagawa, Japan, Dec., 2006).
134.
Electrical Conduction in Low-dimensional Nanostructures,
M. Aono,
Japan-Australia NanomaterialsWorkshop (Canberra, Australia, Nov., 2006)
133.
Electrical Conduction in Low-dimentional Nanostructures for Novel Nanoelectronic Devices,
M. Aono,
Japan-Germany Joint Workshop 2006 (Tokyo, Oct., 2006).
132.
Novel Atomic and Molecular Switches,
M. Aono, T. Nakayama, M. Nakaya, T. Hasegawa, K. Terabe, T. Sakamoto, Y. Kuwahara, M. Akai,
MNC2006 (Kamakura, Japan, Oct., 2006).
131.
Exoring Novel Capabilities of the Scanning Tunneling Microscope,
M. Aono,
LEEM&PEEM-V (Himeji, Japan, Oct., 2006).
130.
Novel Atomic and Molecular Devices,
M. Aono, T. Nakayama, M. Nakaya, T. Hasegawa, K. Terabe, T. Sakamoto, Y. Kuwahara, M. Akai,
2nd Nanoelectronic days (Aachen, Oct., 2006).
129.
Eectrical Conduction in Low Dimensional Nanostructures,
M. Aono, T. Nakayama, Y. Shingaya, O. Kubo, M. Nakaya
TNT2006 (Grenoble, France, Sept. 2006).
128.
Electrical Conduction in Low Dimensional Nanostructures measured by Multiprobe Scanning Tunneling Microscopes,
M. Aono,
IWQ3MS (Hefei, China, Aug., 2006).
127.
Diffusive, Ballistic and Polaronic Electrical Conduction in One-dimensional Nanowires,
M. Aono,
NANO2006 (Bangalore, India, Aug., 2006).
126.
Multiprobe Scanning Tunneling Microscopes and Related Methods - Development, Application and Prospects ,
M. Aono,
ICN+T 2006 (Basel, Switzerland, July-Aug, 2006).
125.
Electrical Conductivity of Organic and Inorganic Nanowires Measured by Multi-probe Scanning Tunneling Microscopes,
M. Aono,
APS March Meeting 2006 (Baltimore, U.S.A., March 2006).
124.
Atomic and Molecular Switches for Nanolectronics,
M. Aono,
The Sixth France-Japan Workshop on Nanomaterials (Sapporo, Japan, March 2006).
123.
Ballistic, Diffusive, and Polaronic Electrical Conduction in Nanowires - Observation by Multiprobe Scanning Tunneling Microscopes -,
M. Aono,
1st Asian Pacific Symposium on Nanoscicen and Frontier Materials (Tokyo, Japan, Feb., 2006).
122.
Ballistic, diffusive, and polaronic electrical conduction in organic and inorganic nanowires obsrved by multiple-probe scanning tunneling microscopes,
M. Aono,
ALC'05 (Big Island, Hawaii, U.S.A., Dec. 2005)
121.
Novel atomic and molecular switches,
M. Aono,
SIMD5-NPMS7 (Maui, Hawaii, U.S.A., Dec. 2005).
120.
Control of local polymerization and depolymerization using a scanning probe,
M. Aono,
ISSS-4 (Omiya, Japan, Nov., 2005).
119.
Invention, development and application of the atomic switch,
M. Aono,
TNT2005 (Oviedo, Spain, Aug., 2005).
118.
Measuring at the nanoscale _ development and application of multiple-Probe STMs,
M. Aono,
Seeing at the Nanoscale III (Santabarbara, California, U.S.A., Aug., 2005).
117.
Reversible control of nanoscale chemical and physical processes by the polarity of applied voltage,
M. Aono,
ACSIN-8/ICTF-13 (Stockholm, Sweden, June 2005).
116.
Novel Methods of Structure Fabrication and Property Measurement on the Nanoscale,
M. Aono,
NANOMAT-Birkeland Conference 2005 (Trondheim, Norway, June 2005)
115.
Development and Application of Atomic Switch,
M. Aono,
HP Lalbs/QSR Workshop (Palo Alto, U.S.A., March 2005).
114.
Field and Current Induced Chemical Reactions on the Nanoscale,
M. Aono,
ICYC Workshop (Mishima, Japan, Jan. 2005).
113.
Electrical conduction in inorganic and organic nanostructures,
M. Aono,
nanoPHYS’05 (Tokyo, Japan, Jan. 2005)
112.
Fabrication, characterization and organization of nanostructures,
M. Aono,
1st International Symposium on the Functionality of Organized Nanostructures (FON’04) (Tsukuba, Japan, Dec. 2004).
111.
Reversible control of polymerization and depolymerization on the nanoscale,
M. Aono,
5th Japan-France Workshop on Nanomaterials (Bordeaux, France, Oct. 2004).
110.
Controlling local polymerization and depolymerization reversibly using a scanning probe,
M. Aono
TNT2004 (Segovia, Spain, Sept. 2004).
109.
Innovation of STM for nanotechnology research,
M. Aono,
The Japan-Korea Nano Analytical Technology Symposium (Makuhari, Japan, Sep. 2004).
108.
Polymerization and depolymerization controlled by a scanning tunneling microscope tip,
M. Aono,
The 6th Taipei Symposium on Surfaces, Thin Films, and Nano Science (Taipei, Taiwan, Aug. 2004).
107.
Controlling local polymerization and depolymerization reversibly using a scanning probe tip,
M. Aono,
Ｓwiss-Japanese Nanoscience Workshop (Nara, Japan, June 2004).
106.
Sciengineering" on the nanoscale,
M. Aono,
3rd Int. Conf. Computational Modeling and Simulartion of Materials (Sicily, Italy, June 2004).
105.
Controlling local polymerization and depolymerization reversibly using a scanning probe,
M. Aono,
Beijing-TEDA 2004 Scanning Probe Microscopy, Sensors and Nanotructures (Beijing, China, May 2004).
104.
Electrical conduction in nanostuctures,
M. Aono,
Japan-US research collaboration for Synchrotron radiation nanomaterials science (Tokyo, Japan, March 2004).
103.
Electrical conduction in organic and inorganic nanostructures,
M. Aono,
APF-9 (Tsukuba, Japan, March 2004).
102.
Dynamic process of molecular wiring and atomic switching,
M. Aono,
NNQP2003 (Tokyo, Japan, Dec. 2003).
101.
Dynamic processes of atomic switching and nanoscale wiring,
M. Aono,
FIMS/ITSNs 2003 (Joint Intern. Symp)(Tsukuba, Japan, Nov. 2003).
100.
Controlling atomic and molecular dynamic processes on the nanometer scale,
M. Aono,
ACSIN-7 (Nara, Japan, Nov. 2003).
99.
Dynamic processes of nanoscale wiring and atomic switching,
M. Aono,
Intern. Symp. On Functional Semiconductor Nanosystems (FSNS2003) (Atsugi, Japan, Nov. 2003)
98.
Exploring novel abilities of scanning tunneling microscopy,
M. Aono,
1st Intern. Symp. on Active Nano-characterization and Technology (Tsukuba, Japan, Nov. 2003).
97.
Dynamic processes on the nanoscale,
M. Aono,
Mext Workshop "International Workshop on Smart Interconnects" (Atami, Japan, Nov. 2003).
96.
Controlling dynamic processes on the nanoscale,
M. Aono,
第８回IUMRS先進材料国際会議 (IUMRS-ICAM 2003) (Yokohama, Japan, Oct. 2003).
95.
Control of atomic and molecular dynamic processes on the nanoscale,
M. Aono,
4th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC’03) (Kauai, Hawaii, U. S. A., Oct. 2003).
94.
Control of atomic and molecular dynamic processes on the nanoscale,
M. Aono,
TNT2003 Conference (Salamanca , Spain, Sept. 2003).
93.
Novel methods of structure fabrication and property measurement on the nanoscale,
M. Aono,
TOP NANO(Internarional Nano Conference 2003) (St. Gallen , Switzerland, Sept. 2003).
92.
NanoElectronics in NIMS,
M. Aono,
Asia Pacific NanoElectronics Exhibition and Workshop 2003 (APNEX2003) (Taipei, Taiwan, April 2003).
91.
Multiple probe scanning tunneling microscopes for nanoscale conductivity Measurement,
M. Aono, T. Nakayama, T. Hasegawa, Y. Shingaya, Y. Okawa, Y. Kuwahara, M. Akai, and K. Takami,
Japan-US Workshop (Ithaca, New York, U.S.A, Jan. 2003).
90.
Electrical conduction in low dimentional nanotructures,
M. Aono,
Asian Symposium on Nanotechnology and Nanoscience (Asia NANO 2002) (Tokyo, Japan, Nov. 2002).
89.
Towards novel SPMs with multiple probes,
M. Aono,
The 10th International Colloquium on Scanning Probe Microscopy (Waikiki, Hawaii, U.S.A., Oct. 2002)
88.
Exploring novel abilities of the STM,
M. Aono,
ナノインテリジェント材料／システム／国際シンポジウム（Tokyo, Japan, Oct. 2002）
87.
Exploring novel abilities of the STM,
M.Aono,
TNT 2002 Conference (Santiago de Compostela, Spain, Sept. 2002)
86.
Electrical Conduction in Nanoscale Structures,
M. Aono, T. Nakayama, T. Hasegawa, H. Tanaka, Y. Shingaya, Y. Okawa, Y. Kuwahara, M. Akai, and K. Terabe,
Asia SPM-4 Taipei Symposium on Nanotechnology (Taipei, Taiwan, Aug. 2002).
85.
Polarized light emission from surface states and nanostructures,
M. Aono,
7th International Conference on Nanometer-scale Science and Technology, 21st European Conference on Surface Science (NANO-7/ECOSS-21) (Malmo, Sweden, June 2002).
84.
Electrical conduction in low dimensional nanostructures,
M.. Aono,
2nd IWSITFP (Beijing, China, May 2002).
83.
Electrical conduction in low-dimensional nanostructures,
M. Aono,
QTDM&QFS’2002, The Multilateral Symposium between the Korean Academy of Science and Technology (KAIST) and the Foreign Academies (Seoul, Korea, May 2002).
82.
Dynamic nanoarchitectonics of low-dimensional molecular and atomic nanostructures,
M. Aono,
The Second International Symposium on Nanoarchitectonics Using Supra- interactions (Los Angels, U. S. A., March 2002).
81.
Electron transport in nanoscale films, wires and point contacts,
M. Aono, T. Nakayama, T. Hasegawa, H. Tanaka, Y. Shingaya, Y. Okawa, Y. Kuwahara, and M. Akai,
Annual APS March Meeting 2002 (Indianapolis, U.S. A., March 2002)
80.
Electron transport in nanoscale films, wires and point contacts,
M. Aono, T. Nakayama, T. Hasegawa, H. Tanaka, Y. Shingaya, Y. Okawa, Y. Kuwahara, and M. Akai,
European workshop Materials for Advanced Metallization (Vaals, The Netherlands, March 2002).
79.
Nanoelectronics in Japan : Efforts to understand electrical conduction in low-dimensional nanostructures,
M. Aono,
The Asia Pacific Nanotechnology Forum Inaugural Conference (Tsukuba, Feb. 2002).
78.
Electron transport in nanoscale films, wires and point contacts,
M. Aono, T. Nakayama, T. Hasegawa, H. Tanaka, Y. Shingaya, Y. Okawa, Y. Kuwahara, and M. Akai,
Symposium on Surface Physics 2002 (Furano, Jan. 2002).
77.
Direct measurement of electrical conductivity of ananoscale films and wires using multiple-probe STMs,
M. Aono, T. Nakayama, T. Hasegawa, H. Tanaka, Y. Shingaya, Y. Okawa, Y. Kuwahara,
AIST International Symposium on Nanotechnology - Potential Industrial Technology in 21st Century _ (Tokyo, Nov. 2001).
76.
Electrical conduction in nanoscale films, wires and point contacts,
M. Aono, T. Nakayama, T. Hasegawa. H. Tanaka, Y. Shingaya, Y. Okawa, Y. Kuwahara, and M. Akai,
Japanese-Swiss Workshop _ Nanoscience II: From microfabrication to single molecular recognition (Pontresina, Switzerland, Sept. 2001).
75.
Electrical conduction of nanowires and point contacts
M. Aono, T. Nakayama, T. Hasegawa, Y. Okawa, and Y. Kuwahara,
TNT2001 Conference (Segovia, Spain, Sept. 2001).
74.
Electrical conduction in nanoscale films, wires, and point contacts,
M. Aono,
11th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (Vancouver, Canada, July 2001).
73.
Eectrical conduction of ananowire and point contacts,
M. Aono, T. Nakayama, T. Hasegawa. Y. Okawa, and Y. Kuwahara,
First International Workshop on Quantum Nanoplanar Nanostructures & Nanelectronics ’01 (Tsukuba, July, 2001).
72.
A novel atomic switch: Quantum-conductance atomic switch (QCAS),
M. Aono, T. Nakayama, and T. Hasegawa,
International Conference “Nano Science and Technology in the 21st Century”, (Sendai, June, 2001).
71.
Chain-polymerization nanoscale wiring and solid-electrochemical quantum- point-contact switching,
M. Aono,
Gorden Conference on Chemical Reaction at Surface (Ventura, California, USA, Feb. 2001).
70.
Nanoscale fabrication and quantized conductivity,
M. Aono,
Symposium on Surface Science 2001(3S '01) (Furano, Japan, Jan. 2001).
69.
Local and non-local photo- and electro-chemical reactions,
M. Aono,
First International Symposium on Nanoarchitectonics Using Suprainteractions (NASI1) (Tsukuba, Japan, Nov. 2000).
68.
Exploring new methods for nanofabrication and nanocharacterization,
M. Aono,
Strategies in Nanotechnology Japanese German Symposium (Berlin, Germany, Nov. 2000).
67.
Nanoscale fabrication and characterization,
M. Aono,
Asia-Pacific Surface & Interface Analysis Conference (Beijing, China, Oct. 2000).
66.
New Methods for nanoscale fabrication and characterization,
M. Aono,
Trends in Nanotechnology 2000 (TNT2000) (Toledo, Spain, Oct. 2000).
65.
New methods for nanoscale structure fabricatiaon and property measurement,
M. Aono,
The 8th Asia Pacific Physcics Conference (Tapei, Taiwan, Aug. 2000).
64.
New methods for ananoscale structure fabricataion and property measurement,
M. Aono,
2nd UK-Japan Seminar (Harima, Japan, July 2000).
63.
Nanostructure fabrication and property measurement using STM-based new methods,
M. Aono,
5th Intnational Symposium on Advanced Physical Fields (Tsukuba, Japan , Mar. 2000).
62.
New methods to measure electrical , optical, and magnetic properties on the nanometer scale,
M. Aono,
AVS Meeting (46th International Symposium on “Vacuum, Thin Films, Surfaces/ Interfaces and Processing” (Seattle, U. S. A., Oct. 1999).
61.
Structure fabrication and physical property measurement on the nanometer scale,
M. Aono,
9th ICPE, Precision Science and Technology for Perfect Sciences (Osaka, Japan, Aug. 1999).
60.
Nanoscale structure fabrication and property measurement by STM-based new method,
M. Aono,
10th International Conference on Scanning Tunneling Microscopy/ Spectros- copy and Related Proximal Probe Microscopy (STM '99) (Seoul, Korea, July 1999).
59.
New methods to explore novel properties of nanostructures,
M. Aono, C.-S. Jiang, T. Nakayama, T. Okuda, C. Thirstrup, M. Sakurai, Z.-H. Wu, and S. Qiao,
International Symposium on Surface and Interface: Properties of Different Symmetry Crossing (Tokyo, November 1998).
58.
Methods to measure local electrical optical and magnetic properties on the nanometer scale,
M. Aono,
France-Japan Workshop N2M`98 (Toulouse, France, November 1998).
57.
Experimental methods to explore novel properties of nanostructures,
M. Aono, C.-S. Jiang, T. Nakayama, T. Okuda, C. Thirstrup, M. Sakurai, Z.-H. Wu., and S. Qiao,
Spanish-Japanese Symposium on Nano Scale Science (Madrid, Spain, October 1998).
56.
New methods based on STM to measure electrical, optical, and magnetic properties on the nanometer scale,
M. Aono, T. Nakayama, C.-S. Jiang, T. Okuda, C. Thirstrup, M. Sakurai, Z.-H. Wu, and S, Qiao,
1998 Taipei International Symposium on Surfaces and Thin Films (Hsinchu, Taiwan, March 1998).
55.
Measuring electrical, optical, and magnetic properties of nanostructures with new methods based on STM,
M. Aono, T. Nakayama, C.-S. Jiang, T. Okuda, C. Thirstrup, M.Sakurai, Z.-H. Wu, and S. Qiao,
US-Japan Symposium on Surface Science (3S'98) (Park City, Otah, U.S.A., March 1998).
54.
STM-Induced light emission from nanostructures created on hydrogen- terminated silicon surfaces by STM,
C. Thirstrup, M. Sakurai, Z.-H. Wu, T. Nakayama, and M. Aono,
Workshop on Science and Technology of Hydrogen-Terminated Silicon Surfaces (Tsukuba, November, 1997).
53.
Atomic level characterization of electronic and magnetic states by the observation of STM-induced light emission,
Z.-H. Wu, T. Nakayama, C. Thirstrup, M. Sakurai, and M. Aono,
International Symposium on Atomic Level Characterization for New Materials and Devices `97 (Maui, Hawaii, U.S.A., November, 1997).
52.
A few interesting phenomena related to electron tunneling in scanning tunneling microscopy,
Z.-H. Wu, T. Nakayama, M. Sakurai, C.-S.Jiang, and M. Aono,
IFES44 (44th International Field Emission Symposium) (Tsukuba, July, 1997).
51.
Mechanism of atomic-scale lithography,
M. Aono,
Japanese-Swiss Science Seminar: Nanoscience - The Impact of Scanning Probe Microscopy (Ascona, Switzerland, December, 1996).
50.
Medium-energy coaxial impact-collision ion scattering spectroscopy (ME- CAICISS) for subsurface structure analysis,
A. Kobayashi, G. Dorenbos, C. F. McConville, and M. Aono,
IISC-11 (11th International Workshop on Inelastic Ion Surface Collisions) (Wangerooge, Germany, September, 1996).
49.
Physical mechanisms of STM atom manipulation,
M. Aono,
NANO IV (Fourth International Conference on Nanometer-scale Science & Technology) (Beijing, China, September, 1996).
48.
Physical Mechanism of Atom Extraction, Deposition, and Displacement by the Tip of STM,
M. Aono,
ICAMD'96 (Phoenix Park, Kangwon-Do, Korea, June, 1996).
47.
Atom manipulation by the STM and tip-sample interaction,
M. Aono,
Beckman/Hitachi/RIKEN Workshop on Molecular and Electronic Nano- structures (Urbana-Champaign, U.S.A., October, 1995).
46.
STM-based nanostructure fabrication and nano-age tip mechanics,
M. Aono,
NATO Advanced Research Workshop on Nano-age Mechanics (Loch Lomond, Scotland, October,1995).
45.
Atomic-scale surface modification using STM,
M. Aono,
IVC-13/ICSS-9 (Yokohama, Japan, September, 1995).
44.
STM single atom manipulation and its real-time observation,
M. Aono,
Scanning Microscopy 1995 Meeting (Texas, U.S.A., May ,1995).
43.
Methods and mechanisms of atom manipulation by the scanning tunneling microscope,
M. Aono,
7th Intern. Conf. on Solid Films and Surfaces (Hsinchu, Taiwan, December, 1994).
42.
Atomic studies of surface diffusion on solid surfaces,
M. Aono,
1994 IUMRS Intern. Conf. on Electronic Materials (Taiwan, December, 1994).
41.
Manipulation of atoms on semiconductor surfaces,
M. Aono,
7th Intern. Symp. on Small Particles and Inorganic Clusters (Kobe, Japan, September, 1994).
40.
Single-atom manipulation and its real-time detection by STM,
M. Aono,
1994 Intern. Conf. on Solid State Devices and Materials (Yokohama, Japan, August, 1994).
39.
Time-of-flight low- and medium-energy ion scattering spectrometry applied for thin film growth,
M. Aono,
Gordon Res. Conf. on Particle Solid Interactions (Plymouth, U.S.A., August, 1994).
38.
Single atom manipulation and its real-time detection by the STM,
M. Aono,
38th Intern. Symp. on Electron, Ion and Photon Beams (New Orleans, U.S.A. June, 1994).
37.
Japanese perspective on nanotechnology,
M. Aono,
NATO Advanced Research Workshop (Cambridge, U.K., April, 1994).
36.
Science and technology for manipulating single atoms,
M. Aono,
1994 JRCAT Intern. Symp. on Atom Technology (Tokyo, Japan, February, 1994).
35.
Atomic-scale surface structure modification,
M. Aono,
1st Asian Workshop on Scanning Tunneling Microscopy (Sendai, Japan, February,1994).
34.
Extraction, deposition, and displacement of single atoms and their real-time detection,
M. Aono,
JRDC Intern. Symp. on Nanostructures and Quantum Effects (Tsukuba, Japan, November, 1993).
33.
Science and engineering for manipulation atoms by scanning tunneling microscope,
M. Aono,
Intern. Symp. on Quantum Chemistry and Technology in the Mesoscopic Level (Fukui, Japan, September, 1993).
32.
How can we use single-atom manipulation by the STM for surface science?,
M. Aono,
4th Intern. Conf. on the Structure of Surfaces (Shanghai, P. R. China, August, 1993).
31.
Atomic-scale surface modification by the scanning tunneling microscope,
M. Aono,
4th Intern. Conf. on the Formation of Semiconductor Interface (ICFSI-4) (Julich, Germany, June, 1993).
30.
Extraction, deposition, and displacement of single atoms by the STM,
M. Aono,
Workshop on Atomic Order Measurement and Control (Saitama, Japan, April, 1993).
29.
Tip-sample interactions in the STM for atomic-scale surface structure modification,
M. Aono,
Intern. Conf. on Nanoscale Science -Present and Its Future (Sendai, Japan, September, 1992).
28.
Field evaporation from sample and tip in the STM for atomic-scale surface structure modification,
M. Aono,
Conf. on Atomic and Nanoscale Modification of Materials (California, U.S.A., August, 1992).
27.
Field transfer of atoms in the STM,
M. Aono,
Gordon Res. Conf. on the Chemistry and Physics of Microstructure Fabrication (New London, U.S.A, July, 1992).
26.
Atomcraft,
M. Aono,
Intern. Symp. on Trends in Surface Science (Taipei, R.O.C., March, 1992).
25.
Recent progress in low energy ion scattering,
M. Aono,
Intern. Symp. on Trends in Surface Science (Taipei, R.O.C., March, 1992).
24.
Prospects for "Atomcraft",
M. Aono,
Nature's 3rd Conf. on Nanotechnology Science at the Atomic Scale (Tokyo, Japan, January, 1992).
23.
Progress report on atomcraft project,
M. Aono,
Korean Vacuum Soc. (Seoul, Korea, January, 1992).
22.
New or novel properties: Impact and future directions,
M. Aono,
USA-Japan Workshop on Nanoscale Research: Impact and Future Directions (Tokyo, Japan, November, 1991).
21.
Exploring surface and interface structures by coaxial impact-collision ion scattering spectroscopy (CAICISS),
M. Aono,
10th Intern. Conf. on Ion Beam Analysis (Eindhoven, The Netherlands, July, 1991).
20.
On Aono Atomcraft Project and ultra-fine fabrication with STM,
M. Aono,
Focused Ion Beam Symp. (Noda, Japan, June, 1991).
19.
Controlling parameters in nanometer-scale structure fabrication using field evaporation in STM,
M. Aono,
Mini-Symposium on Scanning Tunneling Microscopy (Sendai, Japan, May, 1991).
18.
Structure of the Si(111)√3×√3-Ag surface,
M. Aono, M. Katayama, M.Kato, S. Watanabe, and M. Tsukada,
March Meeting of Amer. Phys. Soc. (Anaheim, U.S.A., March, 1991).
17.
Surface and shallow interface structural analysis by coaxial impact collision ion scattering spectroscopy (CAICISS),
M. Aono,
3rd NEC Symp. on Fundamental Approach to New Material Phases (Hakone, Japan, October 1990).
16.
Structure and electronic state of the CaF2/Si(111) interface in the initial stage of its formation,
S. Kamiya, M. Aono, B. V. King, R. Delay, and M. Katayama,
3rd Intern. Conf. on the Structure of Surface (Milwaukee, U.S.A., July, 1990).
15.
New evident experimantal results on the structure of Si(111)√3×√3R30°-Ag,
M. J. Ramstad, M. Aono, E. Nomura, and M. Katayama,
3rd Intern. Conf. on the Structure of Surfaces (Milwaukee, U.S.A., July, 1990).
14.
Surface structure determination by coaxial impact-collision ion scattering spectroscopy (CAICISS),
M. Aono,
11th Intern. Vacuum Cong. and 7th Intern. Conf. on Solid Surfaces (Cologne, F.R.Germany, September, 1989).
13.
Structural monitoring in real time during heterostructure formation with a novel low energy ion scattering spectroscopy,
M. Aono,
Spring Meeing of Mater. Res. Soc. (San Diego, U.S.A., April, 1989).
12.
Surface structure observation during MBE growth by a novel low energy ion scattering method,
M. Aono,
2nd Intern. Conf. on Formation of Semiconductor Interfaces (Takarazuka, Japan, November, 1988).
11.
Recent development in low-energy ion scattering spectroscopy (ISS) for surface structure analysis,
M. Aono,
7th Intern. Conf. on Ion Implantation Technology (Kyoto, Japan, June, 1988).
10.
Interactions of low-energy He+, Heo, and He* with solid surfaces,
R. Souda and M. Aono,
7th Intern. Conf. on Ion Beam Analysis (Berlin, F. R. Germany, July, 1985).
9.
Structure analysis of Ag overlayers on Si(111) by low-energy Li+ ion scattering,
M. Aono, R. Souda, C. Oshima, and Y. Ishizawa,
1st Intern.Conf. on the Formation of Semiconductor Interfaces (Marseille, France, June, 1985).
8.
Surface structure analysis by impact collision ion scattering spectroscopy,
M. Aono,
31st Natl. Symp. of Amer. Vacuum Soc. (Reno, Nevada, U.S.A., December, 1984).
7.
Structure analysis of semiconductor and inorganic compound surfaces by impact collision ion scattering spectroscopy,
M. Aono,
1st Intern. Conf.on the Structure of Surfaces (Berkeley, U.S.A., August, 1984).
6.
Low energy ion scattering studies of surfaces,
M. Aono,
1984 Gordon Res. Conf. on Particle-Solid Interactions (New Hampshire, U.S.A., July, 1984).
5.
Impact collision ion scattering spectroscopy,
M. Aono,
Amer. Phys. Soc. March Meeting (Detroit, U.S.A., March, 1984).
4.
Atomic structure analysis of silicon surfaces by specialized low-energy ion scattering spectroscopy,
M. Aono,
Amer. Chem. Soc. Symp. on Electron, X-Ray, and Ion Spectroscopies and their Application to Surface Chemistry (Honolulu, Hawaii, U.S.A., December, 1983).
3.
A specialization of low-energy ion scattering spectroscopy and its application to surface studies of TiC,
M. Aono,
30th Nat. Symp. of Amer. Vacuum Soc. (Boston, U.S.A., November, 1983).
2.
Quantitative surface structure analysis by low-energy ion scattering,
M. Aono,
10th Intern. Conf. on Atomic Collision in Solids (Bud Iburg, Germany, July, 1983).
1.
Low energy ion scattering from the Si(111) surface,
M. Aono, R. Souda, C. Oshima, and Y. Ishizawa,
6th Intern. Conf. on Ion Beam Analysis (Tempe, Arizona, U.S.A., May, 1983).