Home > Research > Research Center for Advanced Measurement and Characterization

Advanced Measurement and Characterization Technologies to Accelerate
Materials Innovation

To accelerate the innovation of materials, advanced analysis technologies holds the key to the realization of "super smart society". Our aim is to build an international research center for the development of the superior analytical techniques for advanced materials. Firstly we promote the development of the core competence techniques in the advanced materials analysis domain, and develop joint studies in connection with the research projects in NIMS and in the world. Secondly we show a mediation function between academia and industry.
Lastly, as a core organization of the national innovation system, we play a leading role of the open innovation including personnel training, research and development platform, and the international standardization in the field of advanced materials characterization.


2017.07.12 Update

The 109th AMCP Open Seminar

Schedules 2017.08.24
Development of Silicon-On-Insulator (SOI) Radiation Image Sensors and Interdisciplinary research

2017.07.10 Update Events

60thGREEN & 108thAMCP Joint Open Seminar(The 108th AMCP Open Seminar)

Schedules 2017.07.27 Holding shortly
集束イオンビーム (FIB) を活用した3次元構造解析の最前線

2017.06.14 Update Events

The 106th AMCP Open Seminar

Schedules 2017.09.06
Exploring structural and electronic properties of helical molecules on surfaces

Director-General (Executive Vice President)

"Daisuke FUJITA" Image

Daisuke FUJITA

Inquiry about this page

Research Center for Advanced Measurement and Characterization
Sengen 1-2-1, Tsukuba, Ibaraki 305-0047, JAPAN
Sengen-site, NIMS
E-Mail: amc=ml.nims.go.jp(Please change "=" to "@")
National Institute for Materials Science (NIMS)
1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, JAPAN