Skip to main content
National Institute for Materials Science
日本語
Text Size
Shrink
Enlarge
Access
Contact
About NIMS
About NIMS Top
Related to Organization and Activity
Our Profile
President's Greeting
Organization
Activities and Achievements
Our History
Location (sites)
Research Integrity
Related to Person
Executive
Research Fellows
Executives Emeritus
NIMS Alumni Network
(Open in a new window)
News &
Public Relations
News & Public Relations Top
News Release
News
Press Release
Awarded Prize
Announcement
Public Relations
NIMS NOW International
Publication
Movie
Events
Research
Research Top
Research Centers
Researcher (SAMURAI)
(Open in a new window)
Research Database
Hub & Service
Hub & Service Top
Hub functions & Facility Services
Facility Services
Research Hub Center
Advanced Research Infrastructure for Materials and Nanotechnology
Materials Information
Scientific Information
Collaboration
Collaboration Top
Collaboration
Academic Collaboration
Academic Collaborative Center
Human Resources Development
Device License Agreement with NIMS
S/CASN Device License Agreement
β-Sialon Device License Agreement
RECRUIT
RECRUIT Top
Permanent Employee
Fixed Term Employee
Special Open Call
What attracts you to NIMS
Search
Search
Search
Events
2016
Home
>
Public Relations
>
Events
>
2016
> The 87th AMCP Open Seminar
The 87th AMCP Open Seminar
Schedules 2016.11.14
Finished
Date & Time
November 14, 2016, 13:30 – 14:50
Venue
National Institute for Materials Science (NIMS)
Sengen Main Bldg. 8F Middle Seminar Room →
access
Registration
Pre-registration is not required.
For inquiries, please contact the Administrative Office.
This lecture is open to the public. Your participation is strongly encouraged.
Speaker
1. Dr. Misa Hayashida (National Institute for Nanotechnology, Edmonton, Canada)
2. Prof. Marek Malac (National Institute for Nanotechnology, Edmonton, Canada)
Title
1. Recent developments in TEM tomography and the future prospects
2. Hole free phase plate imaging in a TEM
Abstract
1. Electron tomography in a transmission electron microscope is widely used to obtain three dimensional (3D) visualization of nanoscale objects in both materials and life sciences. I have focused on development of quantitative electron tomography for the past several years. In this presentation, I will explain principle of electron tomography and our recent results at NINT. I also discuss some of the limitations and opportunities in electron tomography development.
2. Zernike-like phase plate contrast can be obtained in a transmission electron microscope by introducing a phase shift between direct and diffracted beams in the back focal plane of objective lens. A particularly convenient implemenation utilizes a uniform thin film with its contrast transfer properties determined by local modifications of the film by the primary electron beam. The need for accurate positioning of the device in back focal plane is eliminated because the phase shifting patch size and position is determined by the primary beam size and position. Such hole free phase plate can increase image contrast by a factor of two to four. While hole free phase plate contrast can not be quantitatively interpreted at present, it can be used to image for example magnetic field inside sample and fringing field in vacuum near sample. It can be also applied to imaging of biological materials. The origin of the hole free phase plate phase shift is not fully understood. In this prentation, example applications and recent development of the contrast origin will be discussed.
Back to List 2016
Related File / Link
Research Center for Advanced Measurement and Characterization
Advanced Measurement and Characterization Project
Summary
Event Title
The 87th AMCP Open Seminar
Venue
National Institute for Materials Science
Sengen Main Bldg. 8F Middle Seminar Room
Schedules Hours
2016.11.14
13:30-14:50
Registration Fee
Free
Contact
Research Center for Advanced Measurement and Characterization Administrative Office
National Institute for Materials Science
1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan
Tel:81-29-859-3861
Fax:81-29-859-2801
E-Mail: amc=ml.nims.go.jp
(Please change "=" to "@")
2024.03
Sun
Mon
Tue
Wed
Thu
Fri
Sat
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
♣
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
Page Top