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The 110th AMCP Open Seminar

Quantitative Annular Dark-Field STEM Imaging for Crystal Structure Analysis

Schedules 2017.09.22 Holding shortly


Date & Time

September 22 (Fri) 2017, 15:00-16:00

Venue

National Institute for Materials Science (NIMS)
Sengen Main Bldg. 8F Middle Seminar Room  → access

Registration

Pre-registration is not required.
For inquiries, please contact the Administrative Office.
This lecture is open to the public. Your participation is strongly encouraged.

Speaker

Shunsuke YAMASHITA (NIMS Postdoctor Researcher, Electron Microscopy Group, RCAMC)

Title

Quantitative Annular Dark-Field STEM Imaging for Crystal Structure Analysis

Abstract


Summary

Event Title
The 110th AMCP Open Seminar
Quantitative Annular Dark-Field STEM Imaging for Crystal Structure Analysis
Venue
National Institute for Materials Science (NIMS)
Sengen Main Bldg. 8F Middle Seminar Room
Schedules Hours
2017.09.22
15:00~16:00
Registration Fee
Free

Contact

Research Center for Advanced Measurement and Characterization Administrative Office
National Institute for Materials Science
1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan
Tel:81-29-859-3861
Fax:81-29-859-2801
E-Mail: amc=ml.nims.go.jp(Please change "=" to "@")
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National Institute for Materials Science (NIMS)
1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, JAPAN
TEL.+81-(0)-29-859-2000
FAX.+81-(0)-29-859-2029