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The 105th AMCP Open Seminar

Nano-structured device observation by synchrotron soft X-ray scanning photoelectron microscopy and development towards multidimensional analysis

Schedules 2017.08.09 Finished


Date & Time

August 9 (Wed) 2017, 15:00-16:00

Venue

National Institute for Materials Science (NIMS)
Sengen Main Bldg. 8F Middle Seminar Roo → access

Registration

Pre-registration is not required.
For inquiries, please contact the Administrative Office.
This lecture is open to the public. Your participation is strongly encouraged.

Speaker

Naoka NAGAMURA (Surface Chemical Analysis Group, RCAMC)

Title

Nano-structured device observation by synchrotron soft X-ray scanning photoelectron microscopy and development towards multidimensional analysis


Summary

Event Title
The 105th AMCP Open Seminar
Nano-structured device observation by synchrotron soft X-ray scanning photoelectron microscopy and development towards multidimensional analysis
Venue
National Institute for Materials Science (NIMS)
Sengen Main Bldg. 8F Middle Seminar Room
Schedules Hours
2017.08.09
15:00~16:00
Registration Fee
Free

Contact

Research Center for Advanced Measurement and Characterization Administrative Office
National Institute for Materials Science
1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan
Tel:81-29-859-3861
Fax:81-29-859-2801
E-Mail: amc=ml.nims.go.jp(Please change "=" to "@")
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National Institute for Materials Science (NIMS)
1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, JAPAN
TEL.+81-(0)-29-859-2000
FAX.+81-(0)-29-859-2029