Synchrotron X-ray Group

We aim to be useful for new development of a new material of both a crystal and amorphous material for an environment, energy and structural field by making use of brilliant synchrotron X-ray diffraction, scattering,
spectroscopy at SPring-8 and other facilities. We elucidate the atomic-scale structure from short to long distances and the electronic structure.
In particular, we develop methods to characterize the material and analyze data using a new structural parameter which can be used for data-driven approach. We also aim at development of an operand X-ray measurement techniques.

Specialized Research Field

  1. Study of short to middle range atomic-distance structures of nano-scale materials and amorphous materials using high-energy X-ray diffraction
  2. Analysis of surface, interface, and thin films using X-ray diffraction crystallography and X-ray standing waves
  3. Study of the state of the electron or chemical bonding in advanced materials using Hard X-ray Photoelectron Spectroscopy
  4. Development of an advanced synchrotron X-ray analysis for an in-situ measurement or an operando measurement


National Institute for Materials Science (NIMS)
1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, JAPAN
TEL.+81-(0)-29-859-2000
FAX.+81-(0)-29-859-2029