Surface Characterization Group

Novel properties and functionality of advanced materials often originate from the phenomena taking place at surface or interface under various environments. Chemical processes, such as oxidation, reduction and etching, utilized for nano structure fabrication and thin film growth, start from the surface or interface under ultra-high vacuum, gas exposure, plasma/photo-irradiation, bias-application conditions. Advanced characterization techniques that enable us to clarify the structure, electronic states, physical properties, functions and reactions at surface and interface under various conditions are therefore crucial for understanding these phenomena. In this group, we are developing (1) surface sensitive and multi-functional nano-probe microscopies operating under various environments for clarifying structure and functions of low-dimensional nanostructures, (2)spin-polarized and state-selected atomic/molecular beams for probing the surface spin polarization and for understanding the mechanism of surface reactions, (3) femtosecond time-resolved spectroscopy for investigating the transport properties and electron phonon coupling at surface and interfaces and (4) X-ray and electron spectroscopies for in situ analysis of the electrochemical processes at various solid/liquid interfaces.

Specialized Research Field

Development of advanced surface and interface characterization techniques and their application to material research  
 
・Atom-resolved scanning probe microscopy under controlled environments 
・Spin-polarized metastable helium beam for surface spin polarization analysis 
・State-selected molecular beam for investigating the dynamics of gas-surface reaction 
・Femtosecond time-resolved spectroscopy for probing ultrafast phenomena at surface and interfaces 
・Operando analysis techniques for investigating interfacial processes in green and energy devices


Group Leader

"Koji KIMOTO" Image

Koji KIMOTO


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1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047 JAPAN
E-Mail: amc=nims.go.jp(Please change "=" to "@")
National Institute for Materials Science (NIMS)
1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, JAPAN
TEL.+81-(0)-29-859-2000
FAX.+81-(0)-29-859-2029