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Magnetic Materials Analysis Group

Multiscale characterization of functional materials.

To understand the structure-property relationships of magnetic and spintronic materials and their devices, various microscopy techniques are employed and though multiscale characterization of functional materials such as soft/hard magnetic materials, spintronic materials and their devices, semiconductor devices using SEM-FIB, TEM and 3DAP techniques to obtain understanding of structure-property relationships. Keeping state-of-the-art nanostructure analysis techniques, including the development of laser assisted 3DAP.

Specialized Research Field

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In order to understand the structure-property relationships of magnetic, spintronic and semiconductor devices, getting quantitative structural and chemical information at interphase interfaces is necessary. To achieve this goal, this group employ the state state-of-the-art electron microscopy and its analytical techniques. In addition, this group is engaged in the development of advance laser assisted 3D atom probe technique.


Group Leader

"Tadakatsu OHKUBO" Image

Tadakatsu OHKUBO


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Magnetic Materials Analysis Group
1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, JAPAN
E-Mail: OHKUBO.Tadakatsu=nims.go.jp(Please change "=" to "@")
National Institute for Materials Science (NIMS)
1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, JAPAN
TEL.+81-(0)-29-859-2000
FAX.+81-(0)-29-859-2029