Electron Microscopy Group

Nano structures should be characterized for the developments of advanced materials. Transmission electron microscopy (TEM) is an effective tool for crystal structure analysis, elemental/chemical-bonding analysis and magnetic domain structure analysis with a high spatial resolution. One of our targets is to develop/improve various advanced electron microscopy; scanning transmission electron microscopy (STEM), electron energy-loss spectroscopy (EELS), energy-dispersive x-ray spectroscopy (EDXS) and Lorentz microscopy. We also apply the advanced microscopy for various materials, e.g., metals, ceramics, semiconductors, collaborating with material scientists in research institutes/companies.

Specialized Research Field

There are a lot of TEM-based analysis techniques, and we study the following subjects.
  • Development of the ultrahigh spatial resolution electron microscopy with spherical aberration collectors.
  • Development of the ultrahigh energy-resolution electron energy-loss spectroscopy with a monochromator.
  • Development of the high accurate and high sensitive structure analysis using advanced electron microscopy.
  • Structural and functional analyses of amorphous materials, including an aqueous solution.
  • Magnetic domain structure analysis of spintronics materilas using Lorentz microscopy.
  • Analyses of the Li-ion battery materials and oxide materials relevant to Elements Strategy.
These studies are partly supported by JST Acceleration Program and MEXT Nano Platform Project.


Group Leader

"Koji KIMOTO" Image

Koji KIMOTO


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Electron Microscopy Group
1-1 Namiki, Tsukuba, Ibaraki 305-0044, JAPAN
E-Mail: KIMOTO.Koji=nims.go.jp(Please change "=" to "@")
National Institute for Materials Science (NIMS)
1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, JAPAN
TEL.+81-(0)-29-859-2000
FAX.+81-(0)-29-859-2029