NIMS NOW International 2005.Vol.3 No.12 <December>

Special Features: Leading-Edge Electron Microscope Technology Supporting Nanotechnology

The Role of the High Voltage Electron Microscopy Station

- Electron Microscopy for Nanotechnology and the 21st Century -

Research Achievements in Nanotechnology Support
The State of the Art in Advanced Electron Microscopy

- Aberration-Correction Technology and Internet Microscopy Technology -

Materials Research using Cryogenic-Temperature Lorentz Electron Microscope
Precise Analysis of Structural Order and Disorder in Co-Based Layered Cuprates
Advanced Materials Analysis using TEM-EELS
Fabrication of Nanostructures Utilizing Substrate Surface Charge Phenomenon and Atomic Level Analysis of the New Nanostructures

- Development of New Nanostructure using Electron Beam Technique -

Nanofabrication at the 1 nm Level using Focused Electron Beam
NIMS NEWS

NIMS Holds Workshop with Polish Institute
MOU with Germany's University of Hannover
Hello from NIMS

Igor Solovyev (Russia)
Yan Ma (China)

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