The 4th ICNSEE Nano-interface Characterization Group Seminar

Date: October 6th (Wed.), 2010 4:00 PM ~ 5:00 PM
Venue: 2nd Conference Room (1F) at Central Bldg in Sengen site, NIMS
Guest Speaker: Dr. Naoya Shibata (University of Tokyo)
Title: "Nanostructure characterization Using Aberration Corrected STEM"
(slides in English, Talk in Japanese)

Contact: Ayako Hashimoto, ICNSEE Nano-interface Characterization Group (NIMS)