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Micromanipulation and Pick-Up System for X-Ray Diffraction Characterization of Micrometer-Sized Single Particles

Light and Particle Beams in Materials Science 2013

Y. Takeichi ( KEK )
N. Inami ( KEK )
T. Ueno ( NIMS )
K. Saito ( KEK )
H. Otori ( KEK )
R. Sagayama ( KEK )
K. Ono ( KEK )

Abstract

We present a micromanipulation and pick-up system to prepare a micrometer-sized singleparticle for X-ray diffraction measurement.
The system consists of piezoelectric linear stages,a microgripper device based on microelectromechanical system (MEMS) [1], a joypadcontroller connected with a control PC.
A sample particle and the gripper can be monitoredsterically through a stereoscopic microscope.
The gripper can pinch a particle sized down toseveral micrometers.
This system is utilized for X-ray diffraction measurement of permanent magnet materials.
Thesample is powder formed and the particles are sticking to each other by magnetostatic force.
By using our system, a single crystal particle can be separated from the powder and mountedonto the tip of the glass capillary.
We also present a success in observing Bragg spots from amicrometer-sized single crystal particle using synchrotron x-ray at BL-8A/B in PhotonFactory.
The obtained diffraction patterns enables us to do structural analysis more preciselythan usual powder diffraction patterns of ferromagnetic materials thanks to the absence ofpreferred orientations.


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