National Institute for Materials Science (NIMS)
- Research Center for Advanced Measurement
   and Characterization Deputy Director-General
- - Electron Microscopy Group Group Leader

1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
E-mail: KIMOTO.Koji*** (***; @ . nims. go. jp)

Research Interest:
- Development/improvement of advanced transmission electron microscopy.
- - Transmission Electron Microscopy (TEM) and Electron Energy-Loss Spectroscopy (EELS).
- - Scanning Transmission Electron Microscopy (STEM) and Annular Dark-Field (ADF) imaging.
- - Other various microscopy techniques.
- Microscopic characterization of advanced materials.
- - Ceramics; oxides, nitrides, strongly-correlated-electron materials.
- - Dielectric materials for semiconductor devices.

Methodologies： High-Voltage Transmission Electron Microscopy (HVTEM), High-Resolution Transmission Electron Microscopy (HRTEM), Convergent-Beam Electron Diffraction (CBED), Coherent Convergent-Beam Electron Diffraction, Electron Energy-Loss Spectroscopy, Energy-Dispersive X-ray Spectroscopy (EDXS), Energy-Filtering Transmission Electron Microscopy (EFTEM), Spatially-Resolved EELS, Fresnel Fringe Method, DV-X alpha, Chemical Lattice Imaging, Scanning Transmission Electron Microscopy (STEM), Annular Dark-Field (ADF) imaging, etc.

Materials： MgO, Au cluster, SiO2/Si interface (bird's beak), Stainless steel (sensitization), metal multilayer (GMR), CoCr alloys for (longitudinal and perpendicular) magnetic recording, interlayer dielectrics (BPSG), DRAM, Gate-oxide (silicon dioxide), silicon oxynitride, interconnection in ULSI, high-k (dielectric constant) material, alumina, high-Tc superconductor cuprate (copper oxide), lithium manganite, high-pressure-synthesized Si3N4, boron nitride, BC2N, superlattice of perovskite oxides, strongly-correlated-electron manganite ((La,Sr)3Mn2O7, (Tb,Ba)MnO3), SiAlON, etc.

Professional Experience:
- 1989 - 1999: Hitachi Research Laboratory, Hitachi, Ltd.
- 1999 - present : National Institute for Materials Science (NIMS).

Awards:
- 2008- Prize of Electron Microscopy Society of Japan (Setou prize).
- 2001- Japanese Society of Electron Microscopy, Young Scientist Award.
- 1997- Japanese Journal of Applied Physics, Young Scientist Award.

Education:
- born in Shinjuku, Tokyo
- Kindergarten and elementary school, Kyoto
- Elementary school, Chiba
- Elementary school and junior high school, Shizuoka
- Shizuoka High School, Shizuoka
- Nagoya University, Nagoya
- Doctor of science, Tohoku University, Sendai

Home town:
- Hisayama-cho, Kasuya, Fukuoka, Japan

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